Team Nanotec CDR70S Critical Dimension AFM Probes

Nanoscience Products: AFM Probes > Critical Dimension AFM Probes > Team Nanotec CDR70S Critical Dimension AFM Probes

Critical Dimension Re-entrant AFM Probes - 70 nm width

Team Nanotec offers CDR70S probes for measuring side wall roughness, slope angle, trench depths, and step height. Each tip is SEM inspected for quality (micrographs available upon request), and each chip is uniquely numbered.

The backside of the cantilever is treated with an Al reflex coating to enhance the reflectivity of the laser beam and prevent light from interfering with the cantilever.

The sensor offers unique features:

re-entrant overhanging tip
monolithic material
highly doped to dissipate static charge
chemically inert
high mechanical Q-factor for high sensitivity

Technical Data	Typical Value
Force Constant	40 N/m
Resonance Frequency	300 kHz
Cantilever Length	125 µm
Cantilever Width	35 µm
Overhang	> 5 nm
Effective Tip Length	> 350 nm
Tip Width	57 - 70 nm

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Qty	Part #	Description	Price
	CDR70S-5	Team Nanotec CDR70S Re-entrant probes - 5 pack Critical Dimension Re-entrant Tip with 57 - 70 nm width, 5 nm overhang and 300 KHz resonance.	$2,990.00
	CDR70S-15	Team Nanotec CDR70S Re-entrant probes - 15 pack Critical Dimension Re-entrant Tip with 57 - 70 nm width, 5 nm overhang and 300 KHz resonance.	$8,260.00