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MFM Probes - Pyramidal Silicon

Nanoscience Products: AFM Probes > MFM Probes - Pyramidal Silicon

Magnetic Force Mode

Designed for magnetic force microscopy, these probes yield a very high force sensitivity and feature a magnetic coating (available in various thicknesses) covering the cantilever and tip.

Show product details for AppNano MAGT Magnetic force mode AFM probes

AppNano MAGT Magnetic force mode AFM probes

Magnetic force mode AFM probes with low, medium, or high moment. Cantilever Length: 225 µm, Spring Constant: 3 N/m , and Resonant freq: 62 kHz.

Powerful image processing software for your AFM or STM system:
SPIP - the Scanning Probe Image Processor

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