All AFM Probes & SPM Supplies
AppNano ACT-TL Tipless Tapping Mode Cantilevers
Applied Nanostructures AC/Tapping mode Tipless AFM probes.Length: 125 µm, Spring Constant: 40 N/m, Resonant freq: 300 kHz
AppNano ACL-TL Tipless Long Tapping Mode Cantilevers
Applied Nanostructures AC/tapping mode long cantilever Tipless AFM probes. Length: 225 µm, Spring Constant: 45 N/m, Res. freq: 190 kHz
ACST-TL Soft Tipless Tapping Mode AFM Probes
Applied Nanostructures Tipless Tapping mode AFM probes. Length: 150 µm, Spring Constant: 7 N/m, Resonant freq: 150 kHz
AppNano FORT-TL Tipless Force Modulation Cantilevers
Applied Nanostructures FORce modulation/Tapping mode Tipless AFM probes. Length: 225 µm, Spring Constant: 3.0 N/m, Res. freq: 62 kHz
AppNano SICON-TL Tipless Contact Mode Cantilevers
Applied Nanostructures SIlicon CONtact mode Tipless AFM probes.Length: 450 µm, Spring Constant: 0.2 N/m, Resonant freq: 12 kHz
AppNano SHOCON-TL Tipless Short Contact Mode Cantilevers
Applied Nanostructures SHOrt CONtact mode Tipless AFM probes.Length: 225 µm, Spring Constant: 0.1 N/m, Resonant freq: 28 kHz
HYDRA Tipless Contact Mode AFM Probes with Nitride Cantilever
AppNano tipless Silicon-Nitride probes for contact mode. Length: 200 µm. Force Constant: 0.035 N/m.
HYDRA Tipless Force Curve/Pulling AFM Probes with Nitride Cantilever
AppNano tipless Silicon-Nitride probes for force measurements in fluid. Length: 100 µm. Force Constant: 0.011 N/m.
Powerful image processing software for your AFM or STM system: SPIP - the Scanning Probe Image Processor
40% off full configurations!
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