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Electrostatic Force (EFM) Probes

Nanoscience Products: AFM Probes > Electrostatic Force (EFM) Probes
EFM Probes for Atomic Force Microscopy
EFM probes are offered with Pt and Pt/Ir coatings and are suitable for electrostatic force measurements (typically done with a force-modulation type cantilever) and other conductive tapping mode AFM applications.

Browse these categories under "Electrostatic Force (EFM) Probes"

Team Nanotec Eletrostatic Force Mode AFM Probes

Team Nanotec Eletrostatic Force Mode AFM Probes

Team Nanotec high resolution EFM probes with Pt coating.
Length: 225 µm; Spring Constant: 3 N/m; Res. freq: 75 kHz

Featured products under "Electrostatic Force (EFM) Probes"
Show product details for AppNano EFM Conductive AFM Probes

AppNano EFM Conductive AFM Probes

Electrostatic force mode AFM probes with Pt/Ir coating, 3.0 N/m spring constant, and 62 KHz resonance.

Show product details for AppNano EFM Conductive AFM Probes
Show product details for AppNano ACCESS <strong><em>'Tip View'</strong></em> Electrostatic Force Mode AFM Probes

AppNano ACCESS 'Tip View' Electrostatic Force Mode AFM Probes

Applied Nanostructures EFM/Electric Force Mode AFM probes with exposed tip. Length: 245 µm, Spring Constant: 3.8 N/m, Resonant freq: 52 kHz

Show product details for AppNano ACCESS <strong><em>'Tip View'</strong></em> Electrostatic Force Mode AFM Probes

Powerful image processing software for your AFM or STM system:AFM & STM Image processing software
SPIP - the Scanning Probe Image Processor

40% off full configurations!




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