Nanoscience Instruments Home
Nanoscience Home Page AFM Probes Store Home Nanoscience Specials Frequenty Asked Questions AFM Probe Advisor Contact Nanoscience Instruments
Login
Register
 

Scanning Probe Microscopy

Specify a quantity for any of the products listed on this page, then click 'Add to Cart' to add them to your shopping cart. If the quantity field is not visible for a product, you must click on the 'More Details' button and select the options or fill out the fields that require your input.
Qty Part # Description Price
B-02-004 -(select options)
Applied Scanning Probe Methods Volumes I-XIII Available
B-02-005
Bhanu P. Jena (Editor), J. K. Heinrich Hörber (Editor)
ISBN: 978-0-471-39628-4
Hardcover
300 pages
July 2006
$153.50
B-02-007
Noncontact Atomic Force Microscopy Volume 2
Series: NanoScience and Technology
Morita, Seizo; Giessibl, Franz J.; Wiesendanger, Roland (Eds.)
2009, XVIII, 401 p. 231 illus., 30 in color., Hardcover
ISBN: 978-3-642-01494-9
$159.00
B-02-006
Michael Bowker (Editor), Philip R. Davies (Editor)
ISBN: 978-3-527-31982-4
Hardcover
270 pages
February 2010
$195.00
B-02-002
Dror Sarid
ISBN: 978-3-527-40617-3
Hardcover
310 pages
March 2007
$200.00
B-02-003
Dawn Bonnell (Editor)
ISBN: 978-0-471-24824-8
Hardcover
512 pages
December 2000
$206.50
B-02-001
Paolo Samori (Editor)
ISBN: 978-3-527-31269-6
Hardcover
570 pages
September 2006
$215.00
B-02-009
Edited by James D. Batteas, Chris A. Michaels and
Gilbert C. Walker
ISBN13: 9780841238831
ISBN10: 0841238839
Hardback, 284 pages
$218.00
B-02-008
Scanning Probe Microscopy in Nanoscience and Nanotechnology
Series: NanoScience and Technology
Bhushan, Bharat (Ed.)
2010, Approx. 1170 p. 300 illus., Hardcover
ISBN: 978-3-642-03534-0
$229.00
B-05-002
Biosystems - investigated by Scanning Probe Microscopy
Fuchs, Harald; Bhushan, Bharat (Eds.)
Based on "Applied Scanning Probe Methods"
2009, XXXII, 834 p., Hardcover
ISBN: 978-3-642-02404-7
$299.00

Powerful image processing software for your AFM or STM system:AFM & STM Image processing software
SPIP - the Scanning Probe Image Processor

40% off full configurations!




US & Canada
888-777-5573

(toll free)

International
+1 480-940-3940


The best prices and the largest selection of AFM probes

Nanoscience Rewards Program

We accept: