Team Nanotec ISC75 sensors are designed for simulatneous measurement of roughness and large step height. The probes have an aspect ratio of 5:1 and a resonance of 75 KHz for light tapping and force modulation mode imaging. This sensor offers these unique features:
High resolution cone-shaped tip
Tip Height: > 9 µm
Typical aspect ratio: 5:1
Typical full cone angle: < 10º over length of 3 µm
Typical tip radius: < 10 nm
monolithic material
highly doped to dissipate static charge
chemically inert
high mechanical Q-factor for high sensitivity
The backside of the ISC75 cantilever is treated with an Al reflex coating to enhance the reflectivity of the laser beam and prevent light from interfering with the cantilever.
Technical Data
Typical Value
Force Constant
3 N/m
Resonance Frequency
75 kHz
Cantilever Length
225 µm
Cantilever Width
35 µm
Tip Style
Conical
Tip Radius
< 10 nm
Tip Height
> 9 µm
Coating
Al reflex
Powerful image
processing software for your AFM or STM system:
SPIP - the Scanning Probe Image Processor