Nanoscience Instruments Home
Nanoscience Home Page AFM Probes Store Home Nanoscience Specials Frequenty Asked Questions AFM Probe Advisor Contact Nanoscience Instruments
Login
Register
 

New Products at the Nanoscience Shop

Find our latest product additions below:


High Resolution Solid Carbon ConeConical AFM Tips
Aspire probes feature the first conically-shaped tips for the mass market. These unique, high-quality silicon AFM probes are suited for a wide range of applications in both research & industry and are compatible with nearly all commercial AFMs.

 


Nano Manipulation and Sensing Devices Nano Manipulation and Sensing
Our nano manipulation and sensing devices include a variety of choices. First, our micro grippers are designed to handle micron sized objects ranging from 1 µm to 100 µm. Second, our force sensing probes feature a unique force sensing range reaching from nanonewtons to millinewtons. Lastly, our micro controllers are available which interface the sensors and grippers with ease.


Access High Frequency ProbesAccess Probes with Direct Optical View of the AFM Tip:
These probes allow a direct optical view of the AFM tip and are designed for applications that require seeing the tip as it engages the surface. They are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging capabilities. Available for Tapping Mode, Force Modulation Mode, and Electrostatic Force Mode.


Large Radius Tip AFM ProbesLarge Radius Tip AFM Probes
These tips offer a defined, large radius, hemispherical tip shape that can be used, for example, for step height measurements over large scan areas. Untreated or chemically modified hemispherical tips are well suited for material characterization and nanoindentation.


High Resolution Solid Carbon ConeHigh Resolution Solid Carbon Cone
High Resolution Solid Carbon Cone AFM probes are designed for tapping, contact, and force modulation mode applications. These probes feature a high resolution solid carbon cone shaped tip (3 nm radius) manufactured by EBID on silicon pedestal and silicon cantilevers. These tips combine high resolution with the ability to scan high aspect ratio structures.


Metal Carbide-Coated Hemispherical ProbesMetal Carbide-Coated Hemispherical Probes
Metal, carbide-coated, hemispherical, cone-shaped AFM probes for tapping, force modulation, contact, or nanoindentation.


AFM Gold Nanoparticle KitAFM Gold Nanoparticle Kit
This is an important product for AFM researchers (characterized colloidal gold particles) which is used for characterization of scanning tip geometry, reliable calibration of the vertical scale of piezoelectric response, and characterizing vertical dimensions of co-absorbed biomolecules


Powerful image processing software for your AFM or STM system:AFM & STM Image processing software
SPIP - the Scanning Probe Image Processor

40% off full configurations!




US & Canada
888-777-5573

(toll free)

International
+1 480-940-3940


The best prices and the largest selection of AFM probes

Nanoscience Rewards Program

We accept: