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Vistaprobes CS Contact or (Fluid Tapping) AFM Probes

Part #:
Vistaprobes Contact mode Short cantilever silicon AFM probes.
Length: 225 µm, Spring Constant: 0.1 N/m , Resonant freq: 28 kHz More details...
Cantilever Length (µm): 225
Res. Frequency (kHz): 28
Spring Constant (N/m): 0.1
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Vistaprobes CS Contact or (Fluid Tapping) AFM Probes

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Product Details
Vistaprobes AFM Probe Product FlyerVistaprobes AFM Tips
( Data Sheet: 340 KB PDF)

Ordering Information

Quantity

Coating

Part Number

Price

Buy Now
10
probes
None CS-10
$195.00
Add to Cart
Al reflex CSR-10 Add to Cart
25
probes
None CS-25 $349.00
$460.00
Add to Cart
Al reflex CSR-25 Add to Cart
400
(full wafer)
None CS-W $3,999.00 Add to Cart
Al reflex CSR-W $4,299.00 Add to Cart


CS AFM probes by VISTAprobes have a shorter cantilever than type CL and are designed for general contact mode applications. The chip design allows for use with all standard AFM chip holders and also the pre-aligned holders on Nanosurf AFMs*. With a tip radius of less than 10 nm, and quantity discounts available on all models, VISTAprobes represent the best value on the market.

For improved laser reflectivity, CSR probes have an aluminum Reflex coating* on the cantilever's detector side. The coating improves laser reflection and does not coat the cantilever's tip.


Technical Data Typical Value Range
Force Constant 0.1 N/m 0.02 - 0.18 N/m
Resonance Freq. 28 kHz 18 - 38 kHz
Length 225 µm 215 - 235 µm
Mean Width 45 µm 40 - 50 µm
Thickness 1.0 µm 0.5 - 1.5 µm
Shape / Cross-section Rectangular / Trapezoidal
Number of Cantilevers 1 per chip
Tip Offset 15 - 25 µm
Tip Style Pyramidal
Tip Height 14 µm 12 - 16 µm
Tip Radius < 10 nm
Material Single Crystal Silicon
Chip Size
(industry standard)
3400 µm (L) x 1600 µm (W) x 300 µm (T)
Coating (optional)* Aluminum reflex ( on non-tip side )

*Reflex coating is required for Nanosurf Atomic Force Microscopes .

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