Noncontact Atomic Force Microscopy Volume 2

Currently Unavailable. Contact us for details or substition recommendations.

*All book sales final. No returns or exchanges.

Description

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

Written for: Scientists, practitioners, graduate students

Keywords:

• Atomic and molecular imaging
• Atomic scale magnetic imaging
• Chemical identification
• Force spectroscopy and mapping
• Tuning fork