Conductive All-Diamond Contact Mode Triangular AFM Probes - 2 pack

Quantity: 2

Data Sheet:

All-diamond AFM Probes

Typical Technical Specifications (Part #: ND-CTCT2-2)

Cantilever	Short	Long
Force Constant	0.71 N/m	0.04 N/m
Resonance Freq.	50 kHz	23 kHz
Cantilever Length	200 µm	300 µm
Cantilever Width	17 µm	23 µm
Cantilever Thickness	1.0 µm	1.0 µm
Cantilever Shape	Triangular	Triangular
Cantilever Curvature	Typically less than 3 degrees
# of Cantilevers	2 per chip
Cantilever Material	Conductive UNCD® nanocrystalline diamond
Resistivity	< 1.0 ohm-cm
Tip Style	Pyramidal	Pyramidal
Tip Height	5.66 µm	5.66 µm
Tip Radius	15-30 nm (nominal) - guaranteed < 50 nm
Tip Offset	9 µm
Tip Material	Conductive UNCD® nanocrystalline diamond
Reflex Coating	Aluminum (~ 60 nm thick, non-tip side)
Chip Size (industry standard)	3600 µm (L) x 1500 µm (W) x 500 µm (T)
Chip Material	Pyrex®

NaDiaProbes^® are the only available AFM probes constructed entirely of diamond. They differ greatly from diamond-coated silicon or silicon nitride probes in that both the cantilever and tip are 100 percent UNCD^®, a thin-film form of nanocrystalline diamond manufactured exclusively by Advanced Diamond Technologies. NaDiaProbes benefit from the unsurpassed hardness of diamond and outlast standard silicon probes by more than 100 times when imaging hard surfaces - without sacrificing tip sharpness. NaDiaProbes also provide enhanced imaging performance on soft, sticky samples because of the low adhesion and low surface energy of diamond.