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Home | News | Archives for January 2019

Month: January 2019

Thin Film Properties graph with normalized indentation depth on the horizontal axis and Young's Modulus on the vertical axis.

Webinar – Nanoindentation for Thin Films: Eliminating the Substrate Error

February 15, 2019January 29, 2019

Join Dr. Devendra Verma of Nanoscience Instruments as he presents the superior physics of the nanoindentation product line we offer from KLA. Learn about how … Read more

Categories Webinars

Webinar – Get The Most Out Of Your Phenom SEM

February 13, 2019January 24, 2019

Join us for a free webinar to learn about the latest and greatest software and hardware features that are available for your Phenom SEM. Gain … Read more

Categories Webinars
QSense Training Course

QSense Training | March 6 – 7 | Phoenix, AZ

January 2, 2019January 2, 2019

We invite you to join us for QSense Training on March 6-7, 2019 in Phoenix, Arizona. The aim of the course is to provide a basic … Read more

Categories Company, Training Courses
  • News Type

  • Technology

January 2019
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The logo of Nanoscience Instruments in White color

  • Home
  • Home
  • Products
    • Scanning Electron Microscopes
      • Phenom Pharos SEM with FEG
      • Phenom XL
      • Phenom Pro / ProX
      • Phenom Pure
    • Electrospinning & Electrospraying
      • Fluidnatek LE-10
      • Fluidnatek LE-50
      • Fluidnatek LE-100
      • Fluidnatek LE-500
    • Contact Angle Optical Tensiometers
      • Attension Theta
      • Attension Theta Lite
      • Attension Theta High Pressure Chamber
      • Attension Theta Topography
    • Force Tensiometers
      • Attension Sigma 700/701
      • Attension Sigma 702
      • Attension Sigma 702ET
      • Attension Sigma 703D
    • Nanoindentation
      • Nanoindenter G200
      • Nanoindenter iMicro
      • Nanoindenter iNano
      • Nanoindenter inSEM
    • Quartz Crystal Microbalance
      • QSense Pro
      • QSense Analyzer
      • QSense Explorer
      • QSense Initiator
    • Optical Profilometers
      • Zeta-20
      • MicroXAM-800
    • Langmuir-Blodgett Troughs
      • KSV NIMA Langmuir Trough
      • KSV NIMA Langmuir-Blodgett Trough
    • Atomic Force Microscopes
      • TraxAFM
      • TraxSTM
      • AFM Probes
    • Tensile Testers
      • Universal Testing Machine T150 UTM
      • Tensile Testing Sample Holder
    • Ion Milling
      • SEMPrep 2
      • UniMill
      • Gentle Mill
    • Correlative Microscopy
      • Delmic SECOM
    • Cathodoluminescence
      • Delmic SPARC
  • Applications
  • Techniques
    • Scanning Electron Microscopy
      • Components in a SEM
    • Electrospinning
      • Electrospinning Components
    • Atomic Force Microscopy
      • Contact Modes for AFM
      • Dynamic Modes for AFM
      • Electrical Modes for AFM
    • Scanning Tunneling Microscopy
    • Optical Profilometry
      • Confocal Profilometry
      • Stylus Profilometry
      • White Light Interferometry
    • Ion Milling
    • Contact Angle Goniometry – Tensiometry
      • Surface and Interfacial Tension
      • Surface Free Energy
    • Quartz Crystal Microbalance (QCM)
    • Langmuir Films
    • Mechanical Testing
      • Microhardness Testing
      • Mechanical Properties
    • Nanoindentation
      • Nanoindentation Methods
      • Mechanical Properties
    • Cathodoluminescence
      • Panchromatic Cathodoluminescence Imaging
      • Hyperspectral Cathodoluminescence Imaging
      • Angle-Resolved Cathodoluminescence Imaging
      • Polarization-Filtered Cathodoluminescence Imaging
  • About Us
    • Company History
    • Career
    • Our People
  • News
    • Webinars
    • Events
  • Contact
  • Support
  • Analytical Services
  • Store
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