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Home > Archives for July 30, 2022

Day: July 30, 2022

Graphite imaged on the Phenom desktop SEM

SEM Image Competition 2022

August 1, 2022July 30, 2022

(Concluded on July 31st, 2022) Nanoscience Instruments welcomes you to our electron micrography contest: a platform to encourage creativity in scanning electron microscopy. Whether it … Read more

Categories Events/Workshops Tags Scanning Electron Microscopy
  • News Type

  • Technology (multiple-select)

July 2022
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The logo of Nanoscience Instruments in White color

  • Home
  • Products
    • Scanning Electron Microscopes
      • Phenom – Desktop SEMs
      • ParticleX – Automated SEMs
      • Axia ChemiSEM – Full Size SEM
    • Cryo-EM and Cryo-ET Solutions
      • Ceres – Ice Contamination Prevention
      • VitroJet – Sample prep for CryoTEM
      • Meteor – CryoCLEM System
    • Surface and Interfacial Analysis
      • Theta – Optical Tensiometers (Contact Angle Goniometers)
      • Sigma – Force Tensiometers
      • QSense – QCM with Dissipation Monitoring
    • Nanomaterial Production
      • Electrospinners & Electrosprayers
      • Nanoparticle Generators
      • KSV NIMA – Langmuir-Blodgett Troughs
    • Electron Microscopy Sample Prep
      • Ion Mills for SEM, TEM, or FIB
      • Sputter Coaters (Au or Pt)
    • SEM Detectors and Solutions
      • Cathodoluminescence (CL) Detectors
      • Correlative Microscopy Detectors
      • Fast-EM – Multibeam SEM
    • TEM Solutions
      • In Situ TEM Holders (Gas, Liquid, Heating, or Biasing)
      • Hybrid Pixel TEM Detectors
  • Applications
  • Techniques
    • Scanning Electron Microscopy
      • Components in a SEM
    • Electrospinning
    • Electrospraying
    • Atomic Force Microscopy
      • Contact Modes for AFM
      • Dynamic Modes for AFM
      • Electrical Modes for AFM
    • Scanning Tunneling Microscopy
    • Optical Profilometry
      • Confocal Profilometry
      • Stylus Profilometry
      • White Light Interferometry
    • Ion Milling
    • Tensiometry (Contact Angle)
      • Surface and Interfacial Tension
      • Surface Free Energy
      • Advancing and Receding Contact Angles
      • Tilting Angle Measurements
      • Surface Tension, Surface Free Energy, and Wettability
      • Captive bubble measurements
      • Corrected contact angle
    • Quartz Crystal Microbalance (QCM)
      • Electrochemical Quartz Crystal Microbalance with Dissipation Monitoring (EQCM-D)
    • Nanoparticle Synthesis
    • Langmuir Films
    • Mechanical Testing
      • Microhardness Testing
      • Mechanical Properties
    • Nanoindentation
      • Nanoindentation Methods
      • Mechanical Properties
    • Cathodoluminescence
      • Panchromatic Cathodoluminescence Imaging
      • Hyperspectral Cathodoluminescence Imaging
      • Angle-Resolved Cathodoluminescence Imaging
      • Polarization-Filtered Cathodoluminescence Imaging
  • About Us
    • Company History
    • Careers
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