Skip to content
480.758.5400
  • Nanoscience Instruments Company logo
  • Products
        • Scanning Electron Microscopes
          • Phenom - Desktop SEMs
          • ParticleX - Automated SEMs
          • Axia ChemiSEM - Full Size SEM
        • TEM Solutions
          • In Situ TEM Holders (Gas, Liquid, Heating, or Biasing)
          • Hybrid Pixel TEM Detectors
        • Cryo-EM Solutions
          • VitroJet - Cryo-EM Sample Prep
          • CERES - Ice Contamination Prevention
          • METEOR - Integrated Cryo-CLEM
        • SEM Detectors and Solutions
          • Cathodoluminescence (CL) Detectors
          • Correlative Microscopy Detectors
          • Fast-EM - Multibeam SEM
        • Surface and Interfacial Analysis
          • Theta - Optical Tensiometers (Contact Angle Goniometers)
          • Sigma - Force Tensiometers
          • QSense - QCM with Dissipation Monitoring
        • Nanomaterial Production
          • Electrospinners & Electrosprayers
          • Nanoparticle Generators
          • KSV NIMA - Langmuir-Blodgett Troughs
        • Electron Microscopy Sample Prep
          • Ion Mills for SEM, TEM, or FIB
          • Sputter Coaters (Au or Pt)
        • Potentiostats
          • Single-Channel Potentiostats
          • Multi-channel Potentiostats & Battery Cyclers
  • Applications
  • Techniques
    • Scanning Electron Microscopy
      • Components in a SEM
    • Electrospinning
      • Overview
      • Needle Vs Needle-Less
    • Electrospraying
    • Transmission Electron Microscopy
    • Atomic Force Microscopy
      • Contact Modes for AFM
      • Dynamic Modes for AFM
      • Electrical Modes for AFM
    • Scanning Tunneling Microscopy
    • Optical Profilometry
      • Confocal Profilometry
      • Stylus Profilometry
      • White Light Interferometry
    • Ion Milling
    • Tensiometry (Contact Angle)
      • Surface and Interfacial Tension
      • Surface Free Energy
      • Advancing and Receding Contact Angles
      • Tilting Angle Measurements
      • Surface Tension, Surface Free Energy, and Wettability
      • Captive bubble measurements
      • Corrected contact angle
    • Quartz Crystal Microbalance (QCM)
      • Electrochemical Quartz Crystal Microbalance with Dissipation Monitoring (EQCM-D)
    • Nanoparticle Synthesis
    • Langmuir Films
    • Mechanical Testing
      • Microhardness Testing
      • Mechanical Properties
    • Nanoindentation
      • Nanoindentation Methods
      • Mechanical Properties
    • Cathodoluminescence
      • Panchromatic Cathodoluminescence Imaging
      • Hyperspectral Cathodoluminescence Imaging
      • Angle-Resolved Cathodoluminescence Imaging
      • Polarization-Filtered Cathodoluminescence Imaging
  • About Us
    • Company History
    • Careers
    • Our People
  • News
    • Blogs
    • Webinars
    • Press Releases
    • Tradeshows & Conferences
    • Events/Workshops
    • Training Courses
  • Contact
  • Support
  • Analytical Services
  • Store

Home > Archives for March 23, 2023

Day: March 23, 2023

Scientist in front of LE-500 electrospinning/electrospraying system

Webinar Series: Electrospinning for Tissue Engineering

March 28, 2023March 23, 2023

In the last webinar of this series, Dr. Francisco J. Chaparro will debunk some common misconceptions about Electrospinning and demonstrate that you can scale up production of electrospun materials from single-needle throughput to industrial scale without sacrificing the high standard of quality that biomedical products demand.

Categories Webinars Tags Electrospinning & Electrospraying

  • News Type

  • Technology (multiple-select)


March 2023
S M T W T F S
 1234
567891011
12131415161718
19202122232425
262728293031  
« Feb   Apr »

The logo of Nanoscience Instruments in White color

  • Home
  • Products
    • Scanning Electron Microscopes
      • Phenom – Desktop SEMs
      • ParticleX – Automated SEMs
      • Axia ChemiSEM – Full Size SEM
    • Cryo-EM Solutions
      • VitroJet – Cryo-EM Sample Prep
      • CERES – Ice Contamination Prevention
      • METEOR – Integrated Cryo-CLEM
    • Surface and Interfacial Analysis
      • Theta – Optical Tensiometers (Contact Angle Goniometers)
      • Sigma – Force Tensiometers
      • QSense – QCM with Dissipation Monitoring
    • Nanomaterial Production
      • Electrospinners & Electrosprayers
      • Nanoparticle Generators
      • KSV NIMA – Langmuir-Blodgett Troughs
    • Electron Microscopy Sample Prep
      • Ion Mills for SEM, TEM, or FIB
      • Sputter Coaters (Au or Pt)
    • SEM Detectors and Solutions
      • Cathodoluminescence (CL) Detectors
      • Correlative Microscopy Detectors
      • Fast-EM – Multibeam SEM
    • TEM Solutions
      • In Situ TEM Holders (Gas, Liquid, Heating, or Biasing)
      • Hybrid Pixel TEM Detectors
    • Potentiostats
      • Single-Channel Potentiostats
      • Multi-channel Potentiostats & Battery Cyclers
  • Applications
  • Techniques
    • Scanning Electron Microscopy
      • Components in a SEM
    • Electrospinning
      • Overview
      • Needle Vs Needle-Less
    • Electrospraying
    • Transmission Electron Microscopy
    • Atomic Force Microscopy
      • Contact Modes for AFM
      • Dynamic Modes for AFM
      • Electrical Modes for AFM
    • Scanning Tunneling Microscopy
    • Optical Profilometry
      • Confocal Profilometry
      • Stylus Profilometry
      • White Light Interferometry
    • Ion Milling
    • Tensiometry (Contact Angle)
      • Surface and Interfacial Tension
      • Surface Free Energy
      • Advancing and Receding Contact Angles
      • Tilting Angle Measurements
      • Surface Tension, Surface Free Energy, and Wettability
      • Captive bubble measurements
      • Corrected contact angle
    • Quartz Crystal Microbalance (QCM)
      • Electrochemical Quartz Crystal Microbalance with Dissipation Monitoring (EQCM-D)
    • Nanoparticle Synthesis
    • Langmuir Films
    • Mechanical Testing
      • Microhardness Testing
      • Mechanical Properties
    • Nanoindentation
      • Nanoindentation Methods
      • Mechanical Properties
    • Cathodoluminescence
      • Panchromatic Cathodoluminescence Imaging
      • Hyperspectral Cathodoluminescence Imaging
      • Angle-Resolved Cathodoluminescence Imaging
      • Polarization-Filtered Cathodoluminescence Imaging
  • About Us
    • Company History
    • Careers
    • Our People
  • News
    • Blogs
    • Webinars
    • Press Releases
    • Tradeshows & Conferences
    • Events/Workshops
    • Training Courses
  • Contact
  • Support
  • Analytical Services
  • Store
Terms & Conditions | © 2023 Nanoscience Instruments