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Home > Archives for April 2023

Month: April 2023

Webinar – Observing the Dynamics of Electrochemically Active Matter With Liquid Electron Microscopy

April 13, 2023
Categories Webinars Tags Transmission Electron Microscopy

FT-IR, Raman, and Electron Microscopy Day with Thermo Fisher

April 12, 2023

We are pleased to invite you to an exciting event showcasing the latest advances in scanning electron microscopy (SEM) along with FT-IR and Raman spectroscopy. … Read more

Categories Events/Workshops Tags Scanning Electron Microscopy

  • News Type

  • Technology (multiple-select)


April 2023
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The logo of Nanoscience Instruments in White color

  • Home
  • Products
    • Scanning Electron Microscopes
      • Phenom – Desktop SEMs
      • ParticleX – Automated SEMs
      • Axia ChemiSEM – Full Size SEM
    • Cryo-EM Solutions
      • VitroJet – Cryo-EM Sample Prep
      • CERES – Ice Contamination Prevention
      • METEOR – Integrated Cryo-CLEM
    • Surface and Interfacial Analysis
      • Theta – Optical Tensiometers (Contact Angle Goniometers)
      • Sigma – Force Tensiometers
      • QSense – QCM with Dissipation Monitoring
    • Nanomaterial Production
      • Electrospinners & Electrosprayers
      • Nanoparticle Generators
      • KSV NIMA – Langmuir-Blodgett Troughs
    • Electron Microscopy Sample Prep
      • Ion Mills for SEM, TEM, or FIB
      • Sputter Coaters (Au or Pt)
    • SEM Detectors and Solutions
      • Cathodoluminescence (CL) Detectors
      • Correlative Microscopy Detectors
      • Fast-EM – Multibeam SEM
    • TEM Solutions
      • In Situ TEM Holders (Gas, Liquid, Heating, or Biasing)
      • Hybrid Pixel TEM Detectors
    • Potentiostats
      • Single-Channel Potentiostats
      • Multi-channel Potentiostats & Battery Cyclers
  • Applications
  • Techniques
    • Scanning Electron Microscopy
      • Components in a SEM
    • Electrospinning
      • Overview
      • Needle Vs Needle-Less
    • Electrospraying
    • Transmission Electron Microscopy
    • Atomic Force Microscopy
      • Contact Modes for AFM
      • Dynamic Modes for AFM
      • Electrical Modes for AFM
    • Scanning Tunneling Microscopy
    • Optical Profilometry
      • Confocal Profilometry
      • Stylus Profilometry
      • White Light Interferometry
    • Ion Milling
    • Tensiometry (Contact Angle)
      • Surface and Interfacial Tension
      • Surface Free Energy
      • Advancing and Receding Contact Angles
      • Tilting Angle Measurements
      • Surface Tension, Surface Free Energy, and Wettability
      • Captive bubble measurements
      • Corrected contact angle
    • Quartz Crystal Microbalance (QCM)
      • Electrochemical Quartz Crystal Microbalance with Dissipation Monitoring (EQCM-D)
    • Nanoparticle Synthesis
    • Langmuir Films
    • Mechanical Testing
      • Microhardness Testing
      • Mechanical Properties
    • Nanoindentation
      • Nanoindentation Methods
      • Mechanical Properties
    • Cathodoluminescence
      • Panchromatic Cathodoluminescence Imaging
      • Hyperspectral Cathodoluminescence Imaging
      • Angle-Resolved Cathodoluminescence Imaging
      • Polarization-Filtered Cathodoluminescence Imaging
  • About Us
    • Company History
    • Careers
    • Our People
  • News
    • Blogs
    • Webinars
    • Press Releases
    • Tradeshows & Conferences
    • Events/Workshops
    • Training Courses
  • Contact
  • Support
  • Analytical Services
  • Store
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