Scanning Electron Microscope

Scanning electron microscopy (SEM) provides visual characterization of ceramic and composite material to determine grain size distribution. Combined with energy dispersive x-ray spectroscopy (EDS) for elemental analysis, microstructure can be correlated to material composition.

The Phenom desktop SEM is ideal for characterizing ceramic and composite materials. Navigation between the optical and electron microscope images is synchronized for easy sample translation with the motorized XY stage. The low vacuum mode obtains images without charging and does not decrease the source lifetime.

The backscattered electron detector (BSD) and bright, long-life electron source is a powerful combination to produce SEM images well-suited for contrast-based analysis. This is critical for automating image analysis for grain sizes and size distribution using SEM.Tiled Phenom SEM images of advanced ceramic material and threshold for analysis

Composite image of 30 BSD Phenom SEM images (left) and corresponding threshold analysis (right) for an advanced ceramic material

The Phenom ProX and large stage Phenom XL SEMs have EDS capability. The EDS interface is seamless integrated with the SEM to provide elemental analysis at a specific location, along a line or as a mapped area. Using an EDS map, ceramic grains or composite phases can be correlated to elemental composition. 

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