Nanoscience Instruments aims to provide scalable, high-throughput and often automated imaging and mechanical characterization solitions for industry.
Quantify grain size distribution for ceramic materials using SEM
Automated, high-throughput characterization of phosphate conversion coatings.
Mapping provides information unattainable by bulk mechanical testing
Studying the fracture surfaces of materials to determine the cause of failure.
Use the motorized X/Y stage and the Phenom Programming Interface to fully automate SEM imaging and data processing.
High-throughput Fiber Size and Orientation Analysis
Measure effectiveness of laser processing with optical profilometry
Identify elemental distribution using EDS with SEM
Instrumented indentation mapping of alumina and toughened zirconia
Structure-property-processing optimization of thin films with SEM and EDS