Sample preparation is a critical step to obtain correct and valuable data from high resolution microscopic techniques such as Transmission Electron Microscopy (TEM, XTEM, HRTEM), Scanning Electron Microscopy (SEM), Electron Back Scatted Diffraction (EBSD), Focused Ion Beam (FIB) and many others. Ion milling is the recommended technique for artifact-free and damage free samples to get best data with just few minutes of sample preparation. It can be utilized for fast sample thinning followed by gentle polishing to minimize sample preparation time.
High-resolution electron back scatter diffraction (EBSD) and scanning electron microscopy (SEM) surface/cross-section sample pre…
Focused ion beam (FIB) sample milling for high-performance transmission electron microscopy investigation using the Gentle Mill.
Complete transmission electron microscopy (TEM) sample preparation solution using UniMill.