TEM / SEM Sample Preparation

Sample preparation is a critical step to obtain correct and valuable data from high resolution microscopic techniques such as Transmission Electron Microscopy (TEM, XTEM, HRTEM), Scanning Electron Microscopy (SEM), Electron Back Scatted Diffraction (EBSD), Focused Ion Beam (FIB) and many others. Ion milling is the recommended technique for artifact-free and damage free samples to get best data with just few minutes of sample preparation. It can be utilized for fast sample thinning followed by gentle polishing to minimize sample preparation time.


EBSD Sample Preparation
EBSD Sample Preparation

High-resolution electron back scatter diffraction (EBSD) and scanning electron microscopy (SEM) surface/cross-section sample pre…

FIB-TEM Sample Preparation
FIB-TEM Sample Preparation

Focused ion beam (FIB) sample milling for high-performance transmission electron microscopy investigation using the Gentle Mill.

TEM Sample Preparation
TEM Sample Preparation

Complete transmission electron microscopy (TEM) sample preparation solution using UniMill.