Atomic Force Microscope

The Nano-Observer atomic force microscope (AFM) is designed for high quality imaging with advanced modes to characterize monolayers and thin films on the nanoscale. The topographic information alone may not show material differences, advanced imaging modes are applied to characterize material properties. For example, Kelvin probe force microscopy (KFM) is used to map the surface potential of a sample.  

The Nano-Observer AFM is equipped for all main imaging modes. Engineered for advanced techniques, multiple images can be acquired at the same tip location. For electrical characterization, the ResiScope can be added to provide 10 orders of magnitude in resistance measurements. The Nano-Observer is well-suited to characterize monolayers and thin films, providing high resolution imaging for a wide range of samples.

Related Pages


Contact An Applications Scientist


Captcha Code

Click the image to see another captcha.