Join us at Booth 808 to test drive a Phenom ProX scanning electron microscope (SEM) on-site. We also will have the NEW iMicro Hardness Tester for indentation at our booth.
Stop by to ask about our atomic force microscopes (AFM), 3D Optical Profilers for fast metrology measurements, nanoindenter systems, and Micromechanical Testing Assembly systems. We also offer a variety of standard and specialized AFM probes.
Tuesday, April 26, 2016 Exhibition Hours: 10.00am – 6.30pm
Wednesday, April 27, 2016 Exhibition Hours: 10.00am – 6.30pm
Thursday, April 28, 2016 Exhibition Hours: 10.00am – 2.30pm
International Exposition Center
East Entrance, One I-X Center Drive
Cleveland, Ohio 44135