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MRS Spring 2016

Demo a Phenom SEM on-site!

Phenom ProX scanning electron microsopeJoin us at Booth 228 for the Materials Research Society spring meeitng, now in Phoenix, AZ for the first time! Test drive a Phenom ProX scanning electron microscope (SEM) on-site. 

Stop by to ask about our atomic force microscopes (AFM), 3D Optical Profilers for fast metrology measurements, nanoindenter systems and Micromechanical Testing Assembly systems. We also offer a variety of standard and specialized AFM probes.

NEW: Correlative Microscopy in-SEM products for Materials and Life Sciences.


Tuesday March 29, 2016   9:30 AM - 7:00 PM

Wednesday March 30, 2016   11:00 AM - 5:30 PM

Thursday March 31, 2016   11:00 AM - 1:30 PM

Phoenix Convention Center
100 North 3rd Street
Phoenix, Arizona 85004

Please fill in our survey below to indicate your product interest for our booth display!

 Optical Profilometry
 Mechanical Characterization
 In-SEM cathodoluminescence

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