Electron Microscopy Workshop – University of Connecticut

September 12, 2019 in Storrs, CT | News Type:

Expand your understanding of SEM, SEM/FIB, TEM and TEM/EELS in this free technical workshop seminar hosted by Thermo Fisher Scientific and Nanoscience Instruments.

Learn more about the analytical capabilities and organizational characterizations of electron microscopy instruments and observe a live demonstration of the Thermo Scientific Phenom Desktop SEM.

Join us starting at 8:00 AM for morning lectures and afternoon workshops. Please register by September 9th.

Food will be provided.

What you will experience:

  • Seminars begin at 8:00 A.M. local time
  • Theory overview for all four analytical techniques
  • Overview of capabilities of the UConn Center for Advanced Microscopy and Materials Analysis (CAMMA)
  • Live demonstration of the Phenom Desktop SEM
Date: Thursday September 12th, 2019
The Innovation Partnership Building – University of Connecticut
159 Discovery Dr.
Storrs, CT 06269

Thermo Fisher Scientific LogoNanoscience Instruments Logo


Presenter Title of Talk & Abstract
Roger Ristau
Manager of UConn Center for Advanced Microscopy and Material Analysis
Introduction to SEM and EDXS Tools and Techniques at CAMMA
Numerous electron microscopes at CAMMA offer a wide range of capabilities to address many analytical needs. This talk will detail the fundamentals of SEM and EDXS and describe the latest detectors and methods available at CAMMA.
Rick Passey
Thermo Fisher Scientific SEM/Dual Beam Product and Application Specialist
Industrial Applications of the Focused Plasma Ion Beam: Imaging, Analytics, and Advanced Sample Preparation
The focused ion beam (FIB) has been a critical technique for material characterization, quality control, and failure analysis for over 30 years. This presentation will discuss the plasma FIB technology and provide numerous examples showing how it is being used for failure analysis, 2D/3D material characterization, and TEM/APT sample preparation.
Jan Ringnalda
Thermo Fisher Scientific TEM Product and Application Specialist
Flexibility in Modes and Accelerating Voltages
Optimized for any TEM/STEM Challenge! Modern scanning transmission systems can be used for a multitude of different materials science challenges. By employing modern digital technologies and constant power drivers, it is easy to store, recall and use the microscope in an optimized manner for most experiments. The three-lens condenser systems allows the analytical setup to be modified, depending on what is suitable for the exact sample area being investigated. Examples from multi-user labs will be shown.
Neal Magdefrau
Staff Engineer at United Technologies
Advanced Analytical Tools for Industrial R&D: SEM, TEM & FIB Analysis at UTRC
This talk will show examples of how we use electron optics to solve though problems and develop advanced materials at United Technologies by using state-of-the-art equipment at both United Technologies Research Center and the UConn-Thermo Fisher Scientific CAMMA Facility.