Combining SEM and FTIR Microscopy for Analysis of Foreign Particles

November 18, 2020 | News Type: Technology:

Identifying foreign particles is one of the most common analytical tasks across many industries, from R&D to QA/QC. Due to the diversity in the physical and chemical nature of the particles, the combination of Scanning Electron Microscopy (SEM) and Fourier Transform Infrared (FTIR) Microscopy is often necessary to provide a holistic understanding of the objects under investigation:

  • High resolution images of particles from nanometers to millimeters via SEM
  • Elemental identification in SEM via EDS
  • Chemical identification of organic species via FTIR microscopy

Nanoscience Instruments and Thermo Fisher Scientific invite you to join a webinar about these two powerful analytical techniques. There will be a short talk followed by live product demonstrations of a typical workflow for foreign particle identification using Thermo Scientific’s Phenom Desktop SEM and Nicolet FTIR Microscope.

Combining SEM and IR Microscopy for Analysis of Foreign Particles

Presenter for SEM:
David Marchand, Ph.D.
Applications Marketing Manager
Nanoscience Instruments

Presenter for IR:
Ron Rubinovitz, Ph.D.
Senior Applications Specialist
Thermo Fisher Scientific

(originally aired November 18, 2020)