Identifying foreign particles is one of the most common analytical tasks across many industries, from R&D to QA/QC. Due to the diversity in the physical and chemical nature of the particles, the combination of Scanning Electron Microscopy (SEM) and Fourier Transform Infrared (FTIR) Microscopy is often necessary to provide a holistic understanding of the objects under investigation:
- High resolution images of particles from nanometers to millimeters via SEM
- Elemental identification in SEM via EDS
- Chemical identification of organic species via FTIR microscopy
Nanoscience Instruments and Thermo Fisher Scientific invite you to join a webinar about these two powerful analytical techniques. There will be a short talk followed by live product demonstrations of a typical workflow for foreign particle identification using Thermo Scientific’s Phenom Desktop SEM and Nicolet FTIR Microscope.
Presenter for SEM:
Presenter for IR:
