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Integrated Correlative light-electron microscopy with the SECOM

March 24, 2016 | News Type: Webinars Technology: Correlative Microscopy

Dr. Lennard Voortman discusses the Delmic SECOM and it’s use in correlative light-electron microscopy.

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      • VitroJet – Sample prep for CryoTEM
      • Meteor – CryoCLEM System
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      • Sigma – Force Tensiometers
      • QSense – QCM with Dissipation Monitoring
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      • Electrospinners & Electrosprayers
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    • Electron Microscopy Sample Prep
      • Ion Mills for SEM, TEM, or FIB
      • Sputter Coaters (Au or Pt)
    • SEM Detectors and Solutions
      • Cathodoluminescence (CL) Detectors
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      • Fast-EM – Multibeam SEM
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      • In Situ TEM Holders (Gas, Liquid, Heating, or Biasing)
      • Hybrid Pixel TEM Detectors
  • Applications
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    • Scanning Electron Microscopy
      • Components in a SEM
    • Electrospinning
      • Needle Vs Needle-Less
    • Electrospraying
    • Atomic Force Microscopy
      • Contact Modes for AFM
      • Dynamic Modes for AFM
      • Electrical Modes for AFM
    • Scanning Tunneling Microscopy
    • Optical Profilometry
      • Confocal Profilometry
      • Stylus Profilometry
      • White Light Interferometry
    • Ion Milling
    • Tensiometry (Contact Angle)
      • Surface and Interfacial Tension
      • Surface Free Energy
      • Advancing and Receding Contact Angles
      • Tilting Angle Measurements
      • Surface Tension, Surface Free Energy, and Wettability
      • Captive bubble measurements
      • Corrected contact angle
    • Quartz Crystal Microbalance (QCM)
      • Electrochemical Quartz Crystal Microbalance with Dissipation Monitoring (EQCM-D)
    • Nanoparticle Synthesis
    • Langmuir Films
    • Mechanical Testing
      • Microhardness Testing
      • Mechanical Properties
    • Nanoindentation
      • Nanoindentation Methods
      • Mechanical Properties
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      • Panchromatic Cathodoluminescence Imaging
      • Hyperspectral Cathodoluminescence Imaging
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      • Polarization-Filtered Cathodoluminescence Imaging
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