Portable and easy to use, the all-in-one traxAFM is ready to image anywhere

The Nanoscience Instruments traxAFM is the ideal atomic force microscope for an introduction to nanoscience and nanotechnology.  The system integrates the control electronics with the scanner, which reduces the footprint and overall size of the system. Advanced features are included as standard components.

The traxAFM’s price is also dramatically less than other AFMs, making it by far the most affordable AFM with similar features and durability. Standard, integrated components include:

  • Airflow shielding
  • Vibration isolation
  • XY-table (12 mm)
  • High-resolution, color, top-view camera
  • Side view sample observation
  • Control electronics 

traxAFM features

Standard operating modes include:

  • Contact Mode
  • Dynamic Mode
  • Phase Imaging
  • F-D Curves
  • Magnetic Force Microscopy (MFM) 
  • Electric Force Microscopy (EFM)

Advanced imaging, spectroscopy, and lithography modes are available. 

The traxAFM easily images features from many microns to nanometers.  Pre-aligned optics eliminate the need for any adjustments — making set up quick and easy.

The traxAFM has a simple cantilever exchange. No laser or detector adjustment required. No system setup is needed. Simply plug the USB cable into your PC and start the software. User-friendly software wizards quickly prepare measurement parameters.

TraxAFM tip exchange

Cantilever exchange is quick and simple thanks to the traxAFM’s flip-over scan head design and cantilever exchange tools.

TraxAFM Specifications
TraxAFM Specifications

Options, accessories, and specifications

AFM Probes
AFM Probes

Catalog of AFM probes for a variety of imaging modes

TraxAFM for Nanoscience Education
TraxAFM for Nanoscience Education

Using the traxAFM in a STEM classroom