Atomic Force Microscopes

Compact, easy to use and portable AFMs for research and education.

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TraxAFM

Product Image of the TraxAFM

The Nanoscience Instruments traxAFM is the ideal atomic force microscope for an introduction to nanoscience and nanotechnology.  The system integrates the control electronics with the scanner, which reduces the footprint and overall size of the system. Advanced features are included as standard components.

The traxAFM’s price is also dramatically less than other AFMs, making it by far the most affordable AFM with similar features and durability.

Nanoscience Instruments


Features

The TraxAFM on a table next to a computer

Portable and easy to use

The Nanoscience Instruments traxAFM is the ideal atomic force microscope for an introduction to nanoscience and nanotechnology. The system integrates the control electronics with the scanner, which reduces the footprint and overall size of the system. Advanced features are included as standard components.

Standard, integrated components

  • Airflow shielding
  • Vibration isolation
  • XY-table (12 mm)
  • High-resolution, color, top-view camera
  • Side view sample observation
  • Control electronics

Standard operating modes

  • Contact Mode
  • Dynamic Mode
  • Phase Imaging
  • F-D Curves
  • Magnetic Force Microscopy (MFM)
  • Electric Force Microscopy (EFM)
  • Advanced imaging, spectroscopy, and lithography modes are available.

The traxAFM easily images features from many microns to nanometers. Pre-aligned optics eliminate the need for any adjustments — making set up quick and easy.

Features of the TraxAFM including top view camera, and optional side view camera

Cantilever exchange in the TraxAFM

Simple and quick Cantilever Exchange

The traxAFM has a simple cantilever exchange. No laser or detector adjustment required. No system setup is needed. Simply plug the USB cable into your PC and start the software. User-friendly software wizards quickly prepare measurement parameters.


Options and Accessories

Sideview camera on the TraxAFM

Side view camera: provides a camera view of the tip/sample gapTraxAFM side view with cameraIsolation stage

Extended Sample Kit

SPIP post processing software

View SPIP Software

Advanced Modes Option

  • Imaging: spreading resistance, force modulation
  • Spectroscopy: Current-voltage, stop by end value, forward and backward pause
  • Lithography: draw and load CAD vector graphics, bitmap images

Specifications

Category TraxAFM Specification
Maximum XY-range (resolution) 70 μm (1.0 nm)
Maximum Z-range (resolution) 14 μm (0.2 nm)
Imaging modes Static Force (Contact Mode), Dynamic Force, Phase Contrast, MFM, EFM
Advanced imaging modes Spreading Resistance, Force Modulation
Spectroscopy modes Force–Distance, Amplitude–Distance, Voltage–Distance
Advanced spectroscopy modes Current–Voltage, Stop by end value, Forward & Backward pause
Lithography modes Static Force (Contact Mode), Dynamic Force, Oxidation
Size (LWH) / Weight / Power 204 x 204 x 160 mm / 6.5 kg / 100–240 VAC (30 W)