Create and define thin films

KSV NIMA Langmuir Blodgett instrumentation enables cutting edge innovation in thin film fabrication and characterization.

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Characterize Thin Films

Product image of the KSV NIMA MicroBAM

KSV NIMA Brewster Angle Microscope

MicroBAM (Brewster Angle Microscope) enables visualization of monolayers, typically at the air-water interface in a Langmuir Trough.

By detecting changes in the refractive index of the water surface in the presence of surfactant molecules, MicroBAM provides information on homogeneity, phase behavior and film morphology without the need for any external agents such as fluorescent dyes which could interfere with the Langmuir layer.

Product Image of the KSV NIMA Interfacial Shear Rheometer

KSV NIMA Interfacial Shear Rheometer 

The KSV NIMA Interfacial Shear Rheometer (ISR) is an advanced characterization instrument for studying the viscoelasticity of Langmuir films.

Product Image of the Surface Potential Sensor

KSV NIMA Surface Potential Sensor

The KSV NIMA Surface Potential Sensor (SPOT) is used for determining molecular orientation changes in Langmuir films. Together with the surface pressure sensor included in all KSV NIMA Langmuir and Langmuir-Blodgett Troughs, it gives an in-depth view of the Langmuir monolayer interactions.