Optical Profilometers

Obtain surface morphologies, step heights and surface roughness with a precision focusing pattern or white light.

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Optical Profilometry is a technique used to extract topographical data from a surface. The purposes of profilometry are to obtain surface morphologies, step heights and surface roughness.  These tasks can be accomplished by using a physical probe (stylus) or by using light. Nanoscience Instruments offers two different profilometers which use the light based approach: a structured grid confocal microscope and a white light interferometer.

Image of the Zeta-20

Zeta-20

Structured grid confocal optical profiler

Image of the MicroXAM-800 White Light Interferometer

MicroXAM-800

White light interferometer