Scanning Electron Microscopes

The fastest desktop electron microscopes for high-quality imaging and analysis.

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Compare Phenom SEMs

Model

Phenom XL

Phenom Pro

Phenom Pure

Standalone image of the Phenom XL SEM Standalone image of the Phenom ProX SEM Standalone image of the Phenom Pure SEM
Electron source Ultra high brightness, long life CeB6 crystal source Ultra high brightness, long life CeB6 crystal source Ultra high brightness, long life CeB6 crystal source
Optical navigation camera 3-16x; color image 20-135x; color image  Fixed 20x; black & white image
Electron optical magnification range 80 – 100,000x 80 – 150,000x  80 – 65,000x
Resolution < 10 nm (BSED & SED) < 10 nm (BSED) & < 8nm (SED)  < 25 nm (BSED & SED)
Digital zoom Max. 12x Max. 12x Max. 12x
Acceleration voltages 5 – 20 kV 5 – 15 kV 5 – 10 kV
Vacuum options High, medium, and low vacuum High and low vacuum High and low vacuum
Detector BSD
SED (optional)
EDS (optional)
BSD
SED (optional)
EDS (optional)
BSD
SED (optional)
EDS (optional)
Sample size Max. 100 mm x 100 mm
Up to 36 x 12 mm pin stubs
Max. 32 mm diameter Max. 32 mm diameter
Sample height Max. 65 mm Max. 100 mm Max. 100 mm
Learn more View XL View Pro / ProX View Pure

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