Phenom ParticleX
Fully automated particle analysis with customized packages for technical cleanliness, additive manufacturing, or steel inclusions
Compare Models
Specification |
Phenom Pharos |
Phenom XL / ParticleX / GSR * |
Phenom Pro / ProX |
Phenom Pure |
Electron Source | Field Emission Gun (FEG) | CeB6 crystal | CeB6 crystal | CeB6 crystal |
Max. SEM Magnification | 2,000,000x | 200,000x | 350,000x | 175,000x |
SEM Resolution – SED | <2.0 nm | 10 nm | 6 nm | 15 nm |
SEM Resolution – BSD | 3 nm | 10 nm | 8 nm | 15 nm |
Acceleration Voltages | 1 – 20 kV | 5 – 20 kV | 5 – 20 kV | 5 kV or 10 kV |
Navigation Camera | ✔ | ✔ | ✔ | ✔ |
Motorized Stage | ✔ | ✔ | ✔ | ✔ |
Vacuum Options | High, medium, and low vacuum (software selectable) | High, medium, and low vacuum (software selectable) | High and low vacuum sample holders | High and low vacuum sample holders |
Sample Handling | Single pin stub 25 mm diameter |
Up to 36 pin stubs 100 mm x 100 mm |
Single pin stub 25 mm diameter |
Single pin stub 25 mm diameter |
Detectors | BSD – Four-quadrant backscattered electron detector (standard) SED – Everhart-Thornley secondary electron detector (optional) EDS/EDX/EDAX – Integrated energy dispersive x-ray spectrometer (optional) |
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Learn More | View Pharos | View XL View ParticleX View GSR |
View Pro / ProX | View Pure |