In Situ TEM Sample Holders

Sophisticated In Situ TEM Sample Holder Solutions.

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In Situ TEM Biasing & Heating – Lightning

In Situ TEM Biasing & Heating

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Sample Dynamics under controlled electrical and thermal environment

The Lightning In Situ TEM Biasing & Heating Series provides you the power to obtain real-time information about specimen dynamics triggered by temperature and/or electric fields. Investigate the next generation of nano-electronic materials and devices with the Lightning Series.

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Lightning Nano-Chip: Up to 8 contacts for simultaneous biasing & heating

The Lightning range of Nano-Chips provides researchers with the ability to control the biasing and heating environment of their sample with the highest of precision. Available in different configurations, the Lightning Nano-Chip ensures the full atomic resolution imaging power of the TEM can be maintained while creating the real-world application environment.

MEMS Based Technology

The Lightning Nano-Chips use the latest in MEMS technology to create the lab-on-chip biasing and thermal environment. The unique properties in using metal heating and biasing lines, along with the unique Nano-Chip design provides in situ researchers with the ultimate in control and accuracy.

Sample preparation with conventional techniques

The sample preparation techniques used for preparing traditional TEM samples including lamellas, nanowires and particles are suitable for the Nano-Chip. FIB lamellas are the most commonly used sample for biasing experiments and DENSsolutions in conjunction with some close academic partners have developed a unique FIB workflow using a customised FIB stub specifically designed for the Nano-Chip. This process significantly reduces the total workflow time and makes the success in transfer much higher. Additional methods such as micro-manipulators are suitable for sample preparation onto the Nano-Chip.

400 kV/cm @ RT
Biasing
300 kV/cm @ 900 °C
Simultaneous Heating & Biasing
0.6 Å
Resolution
  • Piezoelectrics
  • ReRam
  • Solar Cells