In Situ TEM Biasing & Heating
Sample Dynamics under controlled electrical and thermal environment
The Lightning In Situ TEM Biasing & Heating Series provides you the power to obtain real-time information about specimen dynamics triggered by temperature and/or electric fields. Investigate the next generation of nano-electronic materials and devices with the Lightning Series.
Lightning Nano-Chip: Up to 8 contacts for simultaneous biasing & heating
The Lightning range of Nano-Chips provides researchers with the ability to control the biasing and heating environment of their sample with the highest of precision. Available in different configurations, the Lightning Nano-Chip ensures the full atomic resolution imaging power of the TEM can be maintained while creating the real-world application environment.
MEMS Based Technology
The Lightning Nano-Chips use the latest in MEMS technology to create the lab-on-chip biasing and thermal environment. The unique properties in using metal heating and biasing lines, along with the unique Nano-Chip design provides in situ researchers with the ultimate in control and accuracy.
Lightning Sample Holders
The Sample Holder is the critical element connecting the Nano-Chip with the microscope and provides in situ researchers with the ability to measure pico amps and apply high voltages up to 100 volts, all within a heated environment. Made from titanium for its optimal mechanical stability, the double tilt Sample Holders provide in situ researchers with the largest application space.
Full Integration & Automation: Heating & biasing control from one interface
Impulse offers a sleek interface that gives you complete control over your sample environment. All the controls for execution and automation of experiments and the data to monitor them, in one clean interface.
- Drag & drop profile builder: Design & automate your experiment
- Flexible graph interface: Large canvas area for re-arrangeable graphs
- Real-time data analysis: Plot Real-time I-V and R-T curves
- Synchronized stimuli data: Correlate between stimuli
Sample preparation with conventional techniques
The sample preparation techniques used for preparing traditional TEM samples including lamellas, nanowires and particles are suitable for the Nano-Chip. FIB lamellas are the most commonly used sample for biasing experiments and DENSsolutions in conjunction with some close academic partners have developed a unique FIB workflow using a customised FIB stub specifically designed for the Nano-Chip. This process significantly reduces the total workflow time and makes the success in transfer much higher. Additional methods such as micro-manipulators are suitable for sample preparation onto the Nano-Chip.
Simultaneous Heating & Biasing
- Solar Cells