Lightning In situ TEM Biasing & Heating
The Lightning in situ TEM biasing and heating solution allows microscopists to observe real time dynamics of functional nanomaterials under controlled and repeatable electrical and thermal stimuli. A state-of-the-art Nano-Chip accurately controls heat and bias while collecting meaningful sample data.
With the possibility to sustain the highest electrical fields and temperatures, individually or simultaneously, a wide range of phenomena now becomes accessible.
Why Lightning?
- Unparalleled capability – Achieve electric fields higher than 300 kV/cm at 900°C
- Measure sample response – perform thermal studies while simultaneously measuring I-V response with pA current sensitivity
- High impact results – minimal displacement even at ΔT = 1000°C and minor bulging preserves resolution without tedious stage movements
Lightning key features
Nano-Chip provides attainable E-fields up to 300 kV/cm at 900°C.
Extremely low drift (< 0.5 nm/min) under heat and bias.
Reliable and homogenous temperature: temperature accuracy better than 96% and temperature uniformity better than 98%.
Sample Holders
The sample holder brings the Nano-Chip into the TEM. Made from titanium for its optimal mechanical stability, the sample holder is carefully designed to integrate into ThermoFisher or JEOL microscopes.
- High stability
Collecting high quality data during dynamic in situ explements requires a stable holder. The Lighning holder demonstrates less than 200 nm of displacement and a short stabilization time even at temperature swings approaching 1000°C, as well as atomic resolution routinely achievable even at high electric fields.
- Compatible with small pole-piece gaps
The Lightning holder can fit in the smallest pole-piece gaps such as the JOEL ARM and the FEI (ThermoFisher) Titan. - Large double-tilt range
Ensure you can reach the zone axis for the sharpest image contrast with our double tilt Lightning HB+ holder. For tilt range specifications, please contact us.
The 3rd generation FIB Stub enables an easier, safer, and quicker preparation of lamella. It is designed to allow the user to prepare a lamella and place it directly on the Nano-Chip, all inside the FIB-SEM. Application Fields:
- Solid state batteries
- ReRam
- Fuel cells
- Phase transformations
- Semiconductor nanodevices
- Solar cells
- Ferroelectrics