In Situ TEM Biasing & Heating
Sample Dynamics under controlled electrical and thermal environment
The Lightning In Situ TEM Biasing & Heating Series provides you the power to obtain real-time information about specimen dynamics triggered by temperature and/or electric fields. Investigate the next generation of nano-electronic materials and devices with the Lightning Series.
Lightning Nano-Chip: Up to 8 contacts for simultaneous biasing & heating
The Lightning range of Nano-Chips provides researchers with the ability to control the biasing and heating environment of their sample with the highest of precision. Available in different configurations, the Lightning Nano-Chip ensures the full atomic resolution imaging power of the TEM can be maintained while creating the real-world application environment.
MEMS Based Technology
The Lightning Nano-Chips use the latest in MEMS technology to create the lab-on-chip biasing and thermal environment. The unique properties in using metal heating and biasing lines, along with the unique Nano-Chip design provides in situ researchers with the ultimate in control and accuracy.
Lightning Sample Holders
The Sample Holder is the critical element connecting the Nano-Chip with the microscope and provides in situ researchers with the ability to measure pico amps and apply high voltages up to 100 volts, all within a heated environment. Made from titanium for its optimal mechanical stability, the double tilt Sample Holders provide in situ researchers with the largest application space.
Full Integration & Automation: Heating & biasing control from one interface
Impulse software gives researchers complete control over their stimuli. With Impulse, you can easily design your In Situ experiment from your desk. Decide which sample conditions you want to be met at which time and Impulse will do the rest.
During your TEM experiment, Impulse will automatically control the sample environment while you focus on the results. Your experiment design is stored so that you can reliably reproduce your results.
- Drag & drop profile builder: Design & automate your experiment
- Flexible graph interface: Large canvas area for rearrangeable graphs
- Real-time data analysis: Plot Real-time I-V and R-T curves
- Synchronized stimuli data: Correlate between stimuli
- Data integration: Synchronize In Situ with TEM data
Sample preparation with conventional techniques
The sample preparation techniques used for preparing traditional TEM samples including lamellas, nanowires and particles are suitable for the Nano-Chip. FIB lamellas are the most commonly used sample for biasing experiments and DENSsolutions in conjunction with some close academic partners have developed a unique FIB workflow using a customised FIB stub specifically designed for the Nano-Chip. This process significantly reduces the total workflow time and makes the success in transfer much higher. Additional methods such as micro-manipulators are suitable for sample preparation onto the Nano-Chip.
Simultaneous Heating & Biasing
- Solar Cells