The Thermo Scientific Phenom ParticleX Desktop SEM (Scanning Electron Microscope) is a multi-purpose desktop SEM designed for multiple applications at the microscale:
- Additive Manufacturing
- Technical Cleanliness
- Steel Manufacturing QC
- Batteries and Energy Storage
- Gunshot Residue Analysis
A versatile solution for high-quality, in-house analysis, the Phenom ParticleX Desktop SEM gives you the ability to carry out speedy characterization, verification, and classification of materials, supporting your production with fast, accurate, and trusted data. The system is simple to operate and fast to learn, opening up particle, material, and failure analysis to a wider group of users.
Beginning October 27, 2021, Thermo Scientific will host a six-part series of weekly webinars. In each, their experts will focus on one particular analysis application and how the Phenom ParticleX Desktop SEM overcomes some of the most common challenges.
|How to certify your NCM powder quality with SEM+EDS||Luigi Raspolini||October 27, 2021||8 a.m. PDT / 11 a.m. EDT|
|Electron-microscope-grade cleanliness in electronics||Luigi Raspolini||November 3, 2021||9 a.m. PDT / 12 p.m. EDT|
|Speed up your automated gunshot residue analysis||Rogier Miltenburg||November 10, 2021||8 a.m. PST / 11 a.m. EST|
|Technical cleanliness analysis with an SEM: Why?||Luigi Raspolini||November 17, 2021||8 a.m. PST / 11 a.m. EST|
|Understand your steel with automated inclusion analysis||Rogier Miltenburg||November 24, 2021||8 a.m. PST / 11 a.m. EST|
|One tool for complete AM powder characterization||Luigi Raspolini||December 1, 2021||8 a.m. PST / 11 a.m. EST|