Struggling with challenging samples?
Unsure of what to do with that “Settings” menu?
Join us as we offer some helpful suggestions for maximizing your SEM imaging and analysis productivity. Learn how to get the best image quality and how to save time with automated analysis on Wednesday, March 25th during our live webinar.
Application scientist James Stanfill, PhD, will be presenting some helpful tips for using your Phenom Desktop SEM including:
- Using the advanced menu for setting acceleration voltage and beam stigmation
- Setting your operating conditions for different detector types and vacuum modes
- When should you use “low”, “image”, “point”, and “map”?
- How to save time with automated analysis: tips for different software available on your instrument
Can’t make the live presentation? Register below for an advanced link for the on-demand presentation.