Scanning Electron Microscopes (SEM) and Transmission Electron Microscopes (TEM) rely heavily on the suitable sample preparation techniques. Ten more minutes spent on sample preparation leads to hundred times better images.
Join Dr. Devendra Verma of Nanoscience Instruments as he presents on the unique features of the Technoorg Linda Ion Milling instruments, SEMPrep2, UniMill and Gentle Mill and how to spend those 10 minutes to enhance the quality of your SEM/TEM images.
- Learn how the SEMPrep2 enables users to prepare both flat and cross-sectional samples with Peltier and Liquid Nitrogen cooling to avoid heat induced artefacts.
- Learn about the fully automated, recipe-based operation and how it offers practically intervention-free sample preparation with the widest beam energy range and unique pre-tilted slope cutting sample holders.
Dedicated systems, SEMPrep2 for SEM samples, UniMill for TEM samples and Gentle Mill for FIB samples provides full solution to all microscopy centers and users.
Date: May 30, 2019
Time: 12 – 1PM (Eastern)
Devendra Verma, Ph.D. Application Scientist – Material & Structural Analysis