Products

Scanning Electron Microscopes

Scanning Electron Microscopes

High performing tabletop SEMs that are fast, intuitive to use and low maintenance with no infrastructure required.

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Atomic Force Microscopes

Atomic Force Microscopes

Compact, easy to use and portable AFMs for research and education.

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Optical Profilometers

Optical Profilometers

Versatile 3D optical profilers with patented focus assist for effortless metrology and imaging in true color.

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Nanoindenters

Nanoindenters

Designed for fast, repeatable, accurate and precise hardness & elastic modulus measurements with unrivaled dynamic measurement performance.

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Mechanical Characterization

Mechanical Characterization

Multi-directional mechanical testers for the nano to milli-Newton force range.

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Correlative Microscopy

Correlative Microscopy

Combining light and electron microscopy for superlative results

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