EM Sample Preparation
Broad Ion Beam Polishers
Broad ion beam polishing is an essential part of the sample preparation process for electron microscopy analysis. This versatile method can remove surface contamination, planarize mechanically cross-sectioned samples, or thin and polish electron-transparent lamellae.
Technoorg Linda has devoted over 35 years to continuous innovation and improvement resulting in outstanding, easy-to-use, and reliable equipment. Their ion milling technology are used in a variety of fields including material science, biological science, geology, failure analysis, metallurgy, battery, aerospace, semiconductor, and electronics in both SEM and TEM preparation.
Artifact-Free Samples
Quickly prepare samples for high quality EBSD, cross-sectional analysis, or atomic-resolution imaging
Automated Operation
Produce high quality samples with minimum user intervention by leveraging an intuitive graphical interface
Unsurpassed Thinning Rates
Variable ion sources for continuous adjustment of milling energy achieves rapid and controlled thinning
Dual Cooling Options
Both liquid nitrogen and Peltier cooling options are available to protect the heat-sensitive samples
See available options
Broad Ion Beam Polisher Models
The newest generation of ion milling equipment from Technoorg Linda operates under a new, uniform platform. Choose from the highest-quality, easiest to use, and most reliable ion polishing tools worldwide. With a focus on compatibility and versatility, each product delivers consistent and controlled milling for high-quality SEM and TEM analysis.
Intelligent SEM Sample Preparation
SEMPREP SMART is a state-of-the-art, automated BIB milling system designed for high-quality SEM sample preparation. A beam of high-energy argon ions bombards the surface to gently removing material at an accelerated rate. This process reveals the true sample underneath by producing damage-free and artifact-free surfaces.
Automated TEM Sample Preparation
UniMill enables rapid, affordable TEM sample preparation without use of a focused ion beam (FIB). Dual ion sources, one high-energy source with unparalleled thinning rates and one patented, low-energy source for final cleaning, work together to create superb electron transparent samples.
Enhance FIB Lamellae for TEM
GentleMill is a stand-alone, automated BIB polishing system designed for post-processing of focused ion beam (FIB) lamellae, some of the hardest-to-produce samples for TEM. Low-energy argon ions are used to perform a final cleaning of the sample surface, gently removing damaged or amorphized layers incurred from high-energy FIB milling.