Ion milling is an essential part of the sample preparation process for electron microscopy analysis. This versatile method can remove surface contamination, planarize mechanically cross-sectioned samples, or thin and polish electron-transparent lamellae.
Technoorg Linda has devoted 25 years to continuous innovation and improvement resulting in outstanding, easy-to-use, and reliable equipment. Their ion milling solutions are used in a variety of fields including materials science, biological science, geology, and multi-layer systems in semiconductor and optical devices.
Quickly prepare samples for high quality EBSD, cross-sectional analysis, or atomic-resolution imaging
Produce high quality samples with minimum user intervention by leveraging an intuitive graphical interface
Variable ion sources for continuous adjustment of milling energy achieves rapid and controlled thinning
Booth liquid nitrogen and Peltier cooling options are available to protect the heat-sensitive samples
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Ion Mill Product Options
Choose from the highest-quality, easiest to use, and most reliable ion milling tools worldwide. With a focus on compatibility and versatility, each product delivers consistent and controlled milling for high-quality SEM and TEM analysis.
The SEMPrep 2 ion mill meets the highest demands. Multifunctional device for slope cutting and damage-free surface polishing offered for SEM and EBSD users.
The UniMill ion mill has been designed for the extremely rapid preparation of high-quality TEM/XTEM samples with an unsurpassed high thinning rate.
Gentle Mill features a patented low energy ion gun for the final cleaning of FIB and TEM samples, complete with a special sample holder for microscope transfer.