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The Phenom Pro and ProX desktop SEMs are high-performance SEMs for the ultimate all-in-one imaging and X-ray analysis systems. A unique and powerful core architecture combines with a host of hardware and software features to provide the most complete desktop SEM solution on the market. Phenom SEMs are equipped with a high brightness Cerium Hexaboride (CeB6) source, allowing for better image resolution through the range of accelerating voltages and a longer source lifetime compared to tungsten sources.
High brightness, long lifetime CeB6 source
Fastest SEM Available
30 seconds from loading to electron imaging
Ease of Use
Designed to be easy to use for both new and experienced users
Phenom Pro can be easily upgraded to the ProX on-site
Phenom Pro / ProX Features
The Phenom Pro desktop SEM is optimized to be the ultimate all-in-one imaging system for any application. For those wanting X-ray elemental analyses, the Phenom ProX comes with our EDS detector. This analysis is fully integrated into our updated user interface, which allows for seamless operation for both new and experienced users.
The innovative design of the Phenoms provides a list of advantages over other desktop SEMs:
- Multiple acceleration voltages (4.8-20.5kV)
- Color optical camera for single-click navigation
- Charge reduction mode reduces need to coat samples
- Upgrade to ProX for fully integrated elemental analysis with EDS detector option
- Secondary electron detector option
- Small footprint – no infrastructure needed
- Low maintenance
- High stability with vibration isolation design
- Multiple sample holders are designed for optimizing sample imaging
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The Power of Phenom
Phenoms are always ready for immediate operation with very low downtime. Unlike tungsten filament-based SEMs which require frequent replacements, electron source changes of Phenoms are far and few between due to incredibly long source lifetimes.
Intuitive Operation and Software
The operating software of each Phenom is clear and navigable, offering easy mouse click and keyboard control with intuitive adjustment of all electron beam settings and imaging parameters — without relying on overwhelming menus or convoluted tutorials.
The Phenom is the only SEM that is insensitive to vibrations. It can be used in noisy environments and does not require special tables or vibration isolation platforms.
Videos & Demos
Phenom Pro / ProX Videos & demos
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Phenom Desktop SEM Detector Options
The Phenom Pro/ProX desktop SEM is compatible with several detectors, including:
The backscattered electron detector (BSD) and secondary electron detector (SED) are responsible for detecting electrons resulting from interactions between the electron beam and sample surface. The two detectors collect different signals that convey varying information about atomic numbers and surface topography.
Energy dispersive X-ray spectroscopy (EDS) provides semi-quantitative elemental composition information by analyzing the X-rays released from atoms when irradiated with electrons. EDS is a non-destructive method for identifying compounds on micro and nanoscales, displayed through colorized elemental mapping.
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Phenom P-Series Desktop SEM Sample Holders
The Phenom P-Series lineup of desktop SEMs is comprised of the Pharos, Pro/ProX, and Pure systems, each compatible with a variety of sample holders for highly specialized applications.
Revealing the hidden features of samples is made possible with the Motorized Tilt & Rotation sample holder. This holder allows for angular tilting and rotation of the sample stage, allowing for imaging of the same area from multiple angles and improved visualization of three-dimensional structures.
The Microtool Sample Holder features an iris style clamp, specially designed for securely holding axially shaped objects or samples with a high aspect ratio. Ideal for observing drill bits, milling tools, and injection needles, simply secure the sample with a non-destructive clamping mechanism and start imaging within minutes.
The Charge Reduction Sample Holders effectively reduces electric charge buildup, minimizing the amount of preparation needed to analyze nonconductive samples. Paper, polymers, organic materials, ceramics, glass, and coatings are but a few of the materials accommodated by these holders.
The Temperature Controlled Sample Holder protects sensitive specimens and enables imaging of hydrated samples by Peltier cooling and heating. With a temperature range of -25°C to 50°C, samples can be maintained at sub-zero temperatures to prevent damage from the vacuum and electron beam.
The Electrical Feedthrough Sample Holder enables in-situ electrical measurements. The holder has six quick release pins that can be used to measure or apply voltages and currents to the sample while it is under the SEM column. This holder is ideal for observation of MEMS devices and for performing failure analysis.
Sample Preparation Tools
Ensure crisp imaging and high quality analysis with automated sample preparation tools.