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Desktop SEM vs Floor Model SEM: A Comparison
In the realms of scientific industry and research, scanning…
The Phenom Pure G6 is an entry-level tabletop SEM (also known as desktop SEM) that provides a straightforward imaging solution perfect for teaching environments or basic R&D applications. The power and innovative design of all Phenom systems are distilled into the perfect imaging platform, offering the best cost to benefit ratio of any tabletop SEM on the market. A high-resolution, color optical camera is included for easy navigation.
Ease of Use
Designed to be easy to use for both new and experienced users
Imaging only platform that provides a perfect solution at the lowest price
Easy Upgrade Path
The Phenom Pure can be upgraded to the Pro or ProX (includes EDS) on-site
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Superb Image Quality
The CeB6 source is 10x brighter than tungsten sources and achieves better resolution at lower accelerating voltages. That means great looking images on any sample.
No User Maintenance
The Phenom tabletop SEM is always ready. The CeB6 source lasts 30x longer than tungsten sources, allowing maintenance-free operation for years at a time.
Easy Upgrade Path
The Phenom Pure can be upgraded to the Pro or ProX on-site. Add a performance package for higher-magnification imaging, a secondary electron detector for better surface sensitivity on organic materials, or an energy dispersive X-ray spectrometer (EDS/EDX) for elemental analysis.
The Phenom is the only tabletop SEM that is insensitive to vibrations. It can be used in noisy environments without limitations
Speed to Image
Only 30 seconds from sample loading to electron imaging. The Phenom is the fastest SEM.
Image non-conducting samples without extra sample preparation or gold coating.
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Phenom SEM Detector Options
The Phenom Pure tabletop SEM supports several modules and stages for highly specialized applications, including:
The backscattered electron detector (BSD) and secondary electron detector (SED) are responsible for detecting electrons resulting from interactions between the electron beam and sample surface. The two detectors collect different signals that convey varying information about atomic numbers and surface topography.
Energy dispersive X-ray spectroscopy (EDS) provides semi-quantitative elemental composition information by analyzing the X-rays released from atoms when irradiated with electrons. EDS is a non-destructive method for identifying compounds on micro and nanoscales, displayed through colorized elemental mapping.
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Phenom P-Series Tabletop SEM Sample Holders
The Phenom P-Series lineup of desktop SEMs (also known as tabletop SEMs) is comprised of the Pharos, Pro/ProX, and Pure systems, each compatible with a variety of sample holders for highly specialized applications.
Revealing the hidden features of samples is made possible with the Motorized Tilt & Rotation sample holder. This holder allows for angular tilting and rotation of the sample stage, allowing for imaging of the same area from multiple angles and improved visualization of three-dimensional structures.
The Microtool Sample Holder features an iris style clamp, specially designed for securely holding axially shaped objects or samples with a high aspect ratio. Ideal for observing drill bits, milling tools, and injection needles, simply secure the sample with a non-destructive clamping mechanism and start imaging within minutes.
The Charge Reduction Sample Holders effectively reduces electric charge buildup, minimizing the amount of preparation needed to analyze nonconductive samples. Paper, polymers, organic materials, ceramics, glass, and coatings are but a few of the materials accommodated by these holders.
The Temperature Controlled Sample Holder protects sensitive specimens and enables imaging of hydrated samples by Peltier cooling and heating. With a temperature range of -25°C to 50°C, samples can be maintained at sub-zero temperatures to prevent damage from the vacuum and electron beam.
The Electrical Feedthrough Sample Holder enables in-situ electrical measurements. The holder has six quick release pins that can be used to measure or apply voltages and currents to the sample while it is under the SEM column. This holder is ideal for observation of MEMS devices and for performing failure analysis.
The Metallurgical Sample Holder is designed to support resin-embedded samples. It comes in two variations – standard and charge reduction, with the option for two sizes of inserts. This holder speeds up SEM analysis for metallurgical samples.
Sample Preparation Tools
Ensure crisp imaging and high quality analysis with automated sample preparation tools.
Reduce electric charging and improve SEM image quality with uniform gold and platinum coatings.
Quickly prepare artifact-free samples for high quality EBSD, failure analysis, and cross-sectional analysis.