Skip to content
480.758.5400
  • Nanoscience Instruments Company logo
  • Products
        • Scanning Electron Microscopes
          • Phenom - Desktop SEMs
          • ParticleX - Automated SEMs
          • Axia ChemiSEM - Full Size SEM
        • TEM Solutions
          • In Situ TEM Holders (Gas, Liquid, Heating, or Biasing)
          • Hybrid Pixel TEM Detectors
        • Cryo-EM and Cryo-ET Solutions
          • Ceres - Ice Contamination Prevention
          • VitroJet - Sample prep for CryoTEM
          • Meteor - CryoCLEM System
        • SEM Detectors and Solutions
          • Cathodoluminescence (CL) Detectors
          • Correlative Microscopy Detectors
          • Fast-EM - Multibeam SEM
        • Surface and Interfacial Analysis
          • Theta - Optical Tensiometers (Contact Angle Goniometers)
          • Sigma - Force Tensiometers
          • QSense - QCM with Dissipation Monitoring
        • Nanomaterial Production
          • Electrospinners & Electrosprayers
          • Nanoparticle Generators
          • KSV NIMA - Langmuir-Blodgett Troughs
        • Electron Microscopy Sample Prep
          • Ion Mills for SEM, TEM, or FIB
          • Sputter Coaters (Au or Pt)
  • Applications
  • Techniques
    • Scanning Electron Microscopy
      • Components in a SEM
    • Electrospinning
    • Electrospraying
    • Atomic Force Microscopy
      • Contact Modes for AFM
      • Dynamic Modes for AFM
      • Electrical Modes for AFM
    • Scanning Tunneling Microscopy
    • Optical Profilometry
      • Confocal Profilometry
      • Stylus Profilometry
      • White Light Interferometry
    • Ion Milling
    • Tensiometry (Contact Angle)
      • Surface and Interfacial Tension
      • Surface Free Energy
      • Advancing and Receding Contact Angles
      • Tilting Angle Measurements
      • Surface Tension, Surface Free Energy, and Wettability
      • Captive bubble measurements
      • Corrected contact angle
    • Quartz Crystal Microbalance (QCM)
      • Electrochemical Quartz Crystal Microbalance with Dissipation Monitoring (EQCM-D)
    • Nanoparticle Synthesis
    • Langmuir Films
    • Mechanical Testing
      • Microhardness Testing
      • Mechanical Properties
    • Nanoindentation
      • Nanoindentation Methods
      • Mechanical Properties
    • Cathodoluminescence
      • Panchromatic Cathodoluminescence Imaging
      • Hyperspectral Cathodoluminescence Imaging
      • Angle-Resolved Cathodoluminescence Imaging
      • Polarization-Filtered Cathodoluminescence Imaging
  • About Us
    • Company History
    • Careers
    • Our People
  • News
    • Webinars
    • Press Releases
    • Tradeshows & Conferences
    • Events/Workshops
    • Training Courses
  • Contact
  • Support
  • Analytical Services
  • Store

Home > Scanning Electron Microscopy

Technology: Scanning Electron Microscopy

  • Scanning Electron Microscopy
  • Electrospinning
  • Quartz Crystal Microbalance
  • Optical Tensiometry
  • Nanoindentation

Empowering Battery Research

By Isabella Germinario | Read Time: 9 minutes

High Resolution Imaging in an Inert Environment Using an SEM Argon-Compatible Phenom XL G2 Desktop SEM The Phenom XL G2 Argon-Compatible Desktop SEM is ideal … Read more

Industry: Batteries Technology: Electrospinning, Quartz Crystal Microbalance, Scanning Electron Microscopy

Electrospun Nanofiber Orientation

By Francisco Chaparro | Read Time: 7 minutes

The popularity of the electrospinning technique continues to grow, and advances in technology are making the workflow easier and more precisely controllable. One important factor … Read more

Industry: Materials Science Technology: Electrospinning, Scanning Electron Microscopy
Paper charging in the Phenom SEM

Reduce Charging in SEM Using Low Voltage Imaging

By Ingrid Koch | Read Time: 6 minutes

Introduction The scanning electron microscope (SEM) is a powerful tool for taking very high magnification images of a variety of materials. It generates an image … Read more

Technology: Scanning Electron Microscopy

Phenom Desktop SEM: ParticleX as an Enabling Technology in Additive Manufacturing

By Zachary Gray | Read Time: 10 minutes

In the past two decades additive manufacturing (AM) has rapidly evolved from a cutting-edge technology into a routine manufacturing method. The ability to quickly print … Read more

Industry: Materials Science Technology: Scanning Electron Microscopy
DIY cloth masks

Effectiveness of DIY masks: How do they work?

By Devendra Verma | Read Time: 4 minutes

The rapid worldwide spread of the novel coronavirus, also known as COVID-19, has upended all conventional thinking regarding the scope of the damage it is … Read more

Industry: Filtration, Materials Science, Medical & Pharmaceuticals Technology: Scanning Electron Microscopy

Effectiveness of Masks: Fast Answers with Automated SEM Analysis

By Devendra Verma | Read Time: 4 minutes

The worldwide spread of COVID-19 has everyone questioning how to protect themselves and help those on the front line of the coronavirus. The CDC recommends … Read more

Industry: Filtration, Materials Science, Medical & Pharmaceuticals Technology: Scanning Electron Microscopy
EDS map analysis with color coated element identification of Zn3(PO4)2 conversion coating

Corrosion Resistant Phosphate Conversion Coatings Analysis

By Matt Jobbins | Read Time: 4 minutes

Rusting of Automobile Frames & Undercarriage For over a decade the automotive industry has been facing a billion-dollar problem of undercarriage corrosion or frame rot. … Read more

Industry: Automotive Technology: Scanning Electron Microscopy

Pharmaceutical Foreign Particle Analysis

By Matt Jobbins | Read Time: 2 minutes

Foreign Particle Analysis with the Scanning Electron Microscopy (SEM) Minimizing foreign particulate contamination in both tablet based and parenteral (injectable) drug compounds is a major … Read more

Industry: Medical & Pharmaceuticals Technology: Scanning Electron Microscopy

Fractography

By Matt Jobbins | Read Time: 3 minutes

Fractography is a method in failure analysis for studying the fracture surface of materials. Studying the characteristics of the fractured surface can help to determine … Read more

Industry: Forensics, Materials Science Technology: Scanning Electron Microscopy

Fiber Surfaces and Coatings

By Matt Jobbins | Read Time: 1 minute

Fibers are often tailored for their respective product using coatings. For example, absorbency or hydrophobicity can be built into fabrics using coated fibers. The surface … Read more

Industry: Materials Science Technology: Optical Profilometry, Scanning Electron Microscopy
Post navigation
Older posts
Page1 Page2 Page3 Next →
  • Industry

  • Technology

  • Material

The logo of Nanoscience Instruments in White color

  • Home
  • Products
    • Scanning Electron Microscopes
      • Phenom – Desktop SEMs
      • ParticleX – Automated SEMs
      • Axia ChemiSEM – Full Size SEM
    • Cryo-EM and Cryo-ET Solutions
      • Ceres – Ice Contamination Prevention
      • VitroJet – Sample prep for CryoTEM
      • Meteor – CryoCLEM System
    • Surface and Interfacial Analysis
      • Theta – Optical Tensiometers (Contact Angle Goniometers)
      • Sigma – Force Tensiometers
      • QSense – QCM with Dissipation Monitoring
    • Nanomaterial Production
      • Electrospinners & Electrosprayers
      • Nanoparticle Generators
      • KSV NIMA – Langmuir-Blodgett Troughs
    • Electron Microscopy Sample Prep
      • Ion Mills for SEM, TEM, or FIB
      • Sputter Coaters (Au or Pt)
    • SEM Detectors and Solutions
      • Cathodoluminescence (CL) Detectors
      • Correlative Microscopy Detectors
      • Fast-EM – Multibeam SEM
    • TEM Solutions
      • In Situ TEM Holders (Gas, Liquid, Heating, or Biasing)
      • Hybrid Pixel TEM Detectors
  • Applications
  • Techniques
    • Scanning Electron Microscopy
      • Components in a SEM
    • Electrospinning
    • Electrospraying
    • Atomic Force Microscopy
      • Contact Modes for AFM
      • Dynamic Modes for AFM
      • Electrical Modes for AFM
    • Scanning Tunneling Microscopy
    • Optical Profilometry
      • Confocal Profilometry
      • Stylus Profilometry
      • White Light Interferometry
    • Ion Milling
    • Tensiometry (Contact Angle)
      • Surface and Interfacial Tension
      • Surface Free Energy
      • Advancing and Receding Contact Angles
      • Tilting Angle Measurements
      • Surface Tension, Surface Free Energy, and Wettability
      • Captive bubble measurements
      • Corrected contact angle
    • Quartz Crystal Microbalance (QCM)
      • Electrochemical Quartz Crystal Microbalance with Dissipation Monitoring (EQCM-D)
    • Nanoparticle Synthesis
    • Langmuir Films
    • Mechanical Testing
      • Microhardness Testing
      • Mechanical Properties
    • Nanoindentation
      • Nanoindentation Methods
      • Mechanical Properties
    • Cathodoluminescence
      • Panchromatic Cathodoluminescence Imaging
      • Hyperspectral Cathodoluminescence Imaging
      • Angle-Resolved Cathodoluminescence Imaging
      • Polarization-Filtered Cathodoluminescence Imaging
  • About Us
    • Company History
    • Careers
    • Our People
  • News
    • Webinars
    • Press Releases
    • Tradeshows & Conferences
    • Events/Workshops
    • Training Courses
  • Contact
  • Support
  • Analytical Services
  • Store
Terms & Conditions | © 2022 Nanoscience Instruments