Custom SEM Image Analysis for Automated Quality Control

Avizo Trueput for Phenom SEM

Transform your Phenom Desktop or Thermo Scientific SEM into a dedicated quality analysis solution with Avizo Trueput Software. Avizo Trueput enables users to automate image processing, feature detection, measurement, and reporting directly from SEM images. Create custom analysis recipes tailored to your specific materials and quality requirements, reducing operator variability while improving throughput and consistency. This powerful tool enables QA/QC teams to maximize efficiency and maintain quality standards, freeing up valuable engineering time for more critical tasks.

Reproducible data interpretation

Standardize protocols across sites for reliable, consistent analysis.

Minimal operator intervention

Simplify workflows to reduce analysis costs and optimize engineering resources.

Unbiased pass/fail results

Generate clear, actionable outcomes with supporting data for confident decision-making.

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Turn Your SEM into a Specialized QA/QC Solution

Many organizations collect thousands of SEM images every year, yet image interpretation often remains manual, subjective, and difficult to scale. 

Avizo Trueput converts microscopy images into objective measurements through customizable analysis workflows that automatically identify features of interest, extract quantitative metrics, and generate standardized reports. 

Phenom Desktop SEMs provide rapid image acquisition with minimal operator training, while Avizo Trueput automatically transforms images into meaningful quality metrics. Together, they create a streamlined workflow from sample loading to report generation. 

Avizo Trueput

Custom Recipes Built Around Your Process

No two manufacturing processes are identical. Avizo Trueput allows users with the help of dedicated software experts to build custom analysis recipes tailored to their materials, defects, and quality requirements. 

Whether you need to measure particles, identify cracks, quantify porosity, evaluate coating quality, classify defects, or something completely different, custom recipes can be developed to automatically perform the analysis in a consistent and repeatable manner. 

Avizo Trueput

Applications

Battery: Primary Particle Analysis

Avizo Trueput automates the analysis of battery materials from powder feedstocks to finished electrodes. Custom recipes can quantify particle size distributions, morphology, porosity, coating uniformity, and defect populations, enabling faster quality control and improved consistency across production batches.

Pharmaceuticals: Particle Size Recipe

Particle morphology and size distribution directly influence drug performance and manufacturing outcomes. Avizo Trueput provides automated characterization of pharmaceutical powders and formulations, delivering objective measurements that support quality assurance and process optimization.

Geology: Grain Boundary analysis

Geological samples often contain complex mixtures of grains, pores, and mineral phases that can be difficult to quantify manually. Avizo Trueput enables automated grain sizing, porosity measurements, and feature classification, helping researchers and manufacturers generate consistent, reproducible results from SEM imagery.

Polymers & Composites: Porosity

Understanding filler dispersion, fiber orientation, and void content is critical for composite performance. Custom analysis recipes can automatically identify and measure these features, providing quantitative data that supports quality control, product development, and failure investigations. 

Electronics: Post calendaring

Avizo Trueput helps automate the detection and measurement of surface defects, coating irregularities, and microstructural features found in electronic components and materials. Standardized workflows improve inspection consistency while reducing the time required for manual review. 

Avizo Trueput

Product Knowledgebase

Accelerating Surface Particle Contamination Control by Combining Fastmicro and Phenom Technologies

Surface particle contamination remains a critical challenge across advanced manufacturing…

Evolution of the Phenom Desktop SEM 

The Phenom Scanning Electron Microscope (SEM) is turning 20 this year! In celebration of t…

SEM & BIB milling for QA, QC, and Failure Analysis in Semiconductor Devices

Introduction As semiconductor devices continue to scale in complexity and shrink in featur…

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