Nanoscience Instruments, Inc.


Phenom Scanning Electron Microscopes
“The Phenom has made a huge difference in our learning cycle.” Neil Gayle of Sonavation
Nanoscience Instruments traxAFM - an all-in-one atomic force microscope
Micromechanical Testing Systems
Highly versatile electro-mechanical testers and assemblers
Zeta 3D Optical Profiler
Zeta-20 provides fast, 3D metrology data in true color
iNano Nanoindenter
iNano nanoindenter provides mechanical properties like modulus and hardness quickly and accurately with high spatial resolution

Nanoscience Instruments has over a decade of experience providing nanotechnology solutions to industry, academic and government researchers and educators.

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Scanning Electron Microscopes, Atomic Force Microscopes, Optical profilers, Nanoindenters: We provide high resolution microscopy, metrology and mechanical testing products.

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Specific applications and solutions ideal for the Phenom SEM, Compact AFMs, and Zeta optical profilers. Download lab manuals and connect to resources for education and outreach.

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News & Events
Advancing Materials Characterization
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Quantitative Electrical Measurements with AFM
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Join us at Booth 519 in Boston
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