Advanced Feature Analysis with PyPhenom

Originally Aired:

Date: February 20, 2025

Abstract:

This webinar dives into the transformative capabilities of feature analysis in Scanning Electron Microscopy (SEM) using Python-powered tools. Discover how PyPhenom automates data extraction, enabling high-resolution measurements that drive innovation in fields like semiconductors, materials science, biomedical research, aerospace, and additive manufacturing.

From thresholding to layer thickness measurements, learn how to harness Python libraries for tailored solutions that minimize errors, save time, and elevate your workflows. Whether you’re detecting micro-defects or analyzing complex patterns, this session will equip you with the knowledge to unlock the full potential of SEM data analysis.

Join us to explore practical applications, script integration, and customized reporting techniques that empower industries to achieve unparalleled accuracy and insight.

Presentation By:

Dr. Michael Stoller
Application Scientist
Nanoscience Instruments



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