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Introduction to Metal Coating Technology for Electron Microscopy


This document is intended to provide the reader with insights into the sputter coating sample preparation technique that is used extensively in electron microscopy (EM) labs worldwide. Metal sputter coating not only prevents sample charging by improving electrical and thermal conduction, but also improves secondary electron emission, reduces electron beam penetration in the sample, providing better edge resolution, and offers a better protection of electron beam sensitive samples.

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