Product Brochure

Subsampling and Inpainting for 2D-STEM & 4D-STEM

Summary:

Stability (from drift), beam damage and slow frame rates in 2D-STEM and 4D-STEM, plus a lack of pre-acquisition surveying in 4D-STEM, are all current limitations in electron microscopy.

The SenseAI STEM tool aims to solve these limitations and become the leading suite for 2D and 4D STEM by combining experiment and analysis into one easy to-use interface.

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