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2025 NanoNews: SEM Edition Q2

We’re excited to share the latest edition of SEM nanoNews with you! You’ll find updates on Phenom software, new additions to our website, and everything you need to know about upcoming events, webinars, blogs, and our expanded image gallery—all centered around Scanning Electron Microscopy (SEM).

Don’t miss out- Follow us on LinkedIn to stay up to date on news, publications and more!

NEWS & UPDATES

We had a fantastic time at the Lehigh Microscopy School last month!

Dr. Jining Xie, William K. Podrazky, and Dr. Vincent Pastore, led hands-on training sessions with the Phenom XL Benchtop SEM, and it was clear that many attendees were genuinely surprised by what this compact system can do.

We fielded a lot of great questions, and these came up again and again:

Can it actually do EDS?

Yes! The Phenoms can be equipped with a Silicon Drift Detector (SDD), offering fast, accurate elemental analysis. The integrated software makes it easy to collect point spectra, line scans, and elemental maps, and allows automation of EDS analysis tasks.

Learn more about the Phenom EDS Detector

This is just a teaching tool, right? Can it even collect publication-quality images?

It is not just for teaching! While they are easy to set up and use, the Phenoms are routinely used in some of the most cutting-edge research labs around the world. Phenom micrographs have been published in many journals and have also won image contests.

Explore the Phenom Image Gallery

It’s always rewarding to experience the excitement generated by the Phenom SEMs and see skepticism turned into enthusiasm!

CONFERENCE CORNER

UPCOMING EVENTS:

Microscopy & Microanalysis 2025

Join us in Salt Lake City, Utah for the highlight of the microscopy calendar – M&M 2025! Nanoscience Instruments is back for this annual summertime conference, and this time we’re showcasing in Booth #1925.

Learn More About M&M 2025

ON-DEMAND WEBINARS

Using Automated SEM/EDS Analysis to Enhance Parts Cleanliness

Maintaining technical cleanliness is critical in industries where contamination can compromise product performance, safety, and compliance. From automotive and aerospace to medical devices and microelectronics, stringent cleanliness standards help mitigate …

Watch On Demand
Superfast Imaging for Electron Microscopy: Up to 100x Faster, 100x Less Data and 100x Less Dose

In this webinar, we will introduce ‘Compressed Sensing’ software from SenseAI, which samples a fraction of the data without loss of any inherent information. This generates images faster with significantly …

Watch On Demand
Applications for Desktop SEM in Geology

Scanning Electron Microscopy (SEM) has become a vital tool in geology, offering high-resolution imaging and elemental analysis for understanding the composition, texture, and geologic history of rocks, minerals, and fossils. …

Watch On Demand

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