Stylus profilometers use a probe to detect the surface, physically moving a probe along the surface in order to acquire the surface height. This is done mechanically with a feedback loop that monitors the force from the sample pushing up against the probe as it scans along the surface. A feedback system is used to keep the arm with a specific amount of torque on it, known as the ‘setpoint’. The changes in the Z position of the arm holder can then be used to reconstruct the surface.
Stylus profilometry requires force feedback and physically touching the surface, so while it is extremely sensitive and provides high Z resolution, it is sensitive to soft surfaces and the probe can become contaminated by the surface. This technique can also be destructive to some surfaces.
Because a stylus profilometer involves physical movements in X, Y, and Z while maintaining contact with the surface, it is slower than non-contact techniques. The stylus tip size and shape can influence the measurements and limit the lateral resolution.
