ParticleX Technical Cleanliness Example Report
Sample Information: Particles are collected on a filter through rinsing the component in a clean environment to minimize additional contamination. The washed surface area is approximately 500 cm2. The filter containing the particles was then dried and loaded into the sample stage using a Filter Stage Insert to firmly secure it, then analyzed in the […]
Phenom Pharos Desktop SEM Brochure
The Phenom Pharos G2 Desktop SEM is the premier field emission desktop scanning electron microscope (SEM), from ThermoFisher, designed to be the most accessible FEG system with the smallest footprint on the market, yet also capable of delivering the highest resolution images of any other desktop SEM.
Phenom Pure Desktop SEM Brochure
The Phenom Pure is an entry-level SEM that provides a straightforward imaging solution perfect for teaching environments
or basic R&D applications. The power and innovative design of all Phenom systems are distilled into the perfect imaging platform,
offering the best cost-to-benefit ratio of any tabletop SEM on the market. Additionally, a high-resolution, color optical camera is included for easy navigation.
Phenom Pro/ProX Desktop SEM Brochure
The Phenom Pro and ProX desktop SEMs are high-performance SEMs for the ultimate all-in-one imaging and X-ray analysis systems. A unique and powerful core architecture combines with a host of hardware and software features to provide the most complete desktop SEM solution on the market. A high-resolution, color optical camera is included for easy navigation.
Attension Theta Wafer Stage Brochure
Contact angle measurements on silicon wafers are crucial for assessing the wettability and surface characteristics of these materials, widely used in electronics manufacturing. By evaluating the angle at which a liquid droplet interfaces with the wafer surface, researchers can gain insights into the surface energy and adhesion properties of the silicon.
SemPrep SMART Product Brochure
The SEMPREP SMART is an advanced ion milling system designed for high-precision sample preparation, particularly for Scanning Electron Microscopy (SEM) and Electron Backscatter Diffraction (EBSD) analysis. The multifunctionality of the SEMPREP SMART allows for slope cutting and damage-free surface polishing, both crucial for obtaining high-quality, reliable imaging and microanalysis.
Why it is Useful to Use Multiple Overtones in QCM Measurements
Apart from using the energy dissipation factor in QCM-measurements, it is possible to gain even more information from a viscoelastic sample by monitoring multiple overtones. In this overview, we take a closer look at what information the overtones offer. We are considering theoretical polymer layers with various thicknesses.
Pharos STEM Product Brochure
The Phenom STEM (scanning transmission electron microscopy) detector enables transmission imaging modes for the Phenom Pharos Desktop SEM. STEM-in-SEM imaging offers increased visibility of sample morphology and reveals subsurface structural details at higher resolutions than conventional SEM. The small footprint and lower operating vacuum also provide a faster workflow compared to conventional STEM instruments for […]
SEMPrep SMART Product Brochure
SEMPREP SMART is equipped with a high-energy and, optionally, a low-energy Ar ion source. This device is an ideal choice for final polishing and cleaning of traditional SEM and EBSD samples. Ion polishing allows for improving and cleaning mechanically polished SEM samples and preparing damage-free surface for EBSD analysis. The device is also suitable for […]
QCM-D Applications in Pharma
Quartz Crystal Microbalance with Dissipation (QCM-D) is a sensitive and versatile analytical technique used to study thin films, biomolecular interactions, and other surface-related processes. QCM-D can provide valuable insights into the adsorption, interaction, and stability of molecules on a solid surface.