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2025 NanoNews: SEM Edition Q4

Welcome to the scanning electron microscopy (SEM) edition of the Nanoscience Instruments newsletter, nanoNews. We are excited to share the latest updates from around the SEM community with you! 
 
In this winter newsletter, you will find recent webinars, white papers, and blogs that highlight the applications of Phenom desktop SEMs across a wide variety of industries and research applications. Additionally, you can find information about our 2-day SEM short courses in Alexandria, Virginia and Phoenix, Arizona. 

If you are interested in more updates about Phenom news, we invite you to follow us on LinkedIn!

NEWS & UPDATES

Phenom XL G3

The new Phenom XL G3 from Thermo Fisher, released earlier this year, has improved hardware compared to the best-selling XL G2. This enables higher quality results with less equipment maintenance. Notable upgrades from the Phenom XL G2 include: 

  • Expanded range of accelerating voltage, from 1.5 kV to 15 kV
  • Improved resolution, < 9 nm
  • Longer source life, 3000 hours 
Learn More

ON-DEMAND WEBINARS

Practical SEM and Ion Mill Applications for Semiconductor R&D to Production

Scanning Electron Microscopes (SEMs) and Cross-sectioning/Polishing tools play a vital role in semiconductor development, from initial materials research to quality assurance in production. Our upcoming webinar will explore how SEMPREP …

Watch On Demand
Unlocking the Power of Desktop SEM for Pharmaceutical Development and Quality Control

As the pharmaceutical industry grows and new products are being researched and manufactured, having access to advanced characterization tools becomes even more critical for improving development and maintaining quality.  Desktop …

Watch On Demand
Automating Battery Materials Analysis using Avizo Trueput with Phenom Desktop SEMs

Battery manufacturers face increasing demands for higher throughput, reproducible quality control, and reduced time-to-market. Traditional manual analysis of electrode materials under the scanning electron microscope (SEM) is often labor-intensive, inconsistent, …

Watch On Demand
Unraveling the Fabric: Exploring Fibers and Textiles with Desktop SEM

From the smoothness of a single fiber to the weave of an entire fabric, microscopic details can reveal critical insights into quality, performance, and innovation. In this webinar, we’ll show …

Watch On Demand

CONFERENCE CORNER

MD&M West 2026 | February 3-5, 2026 | Anaheim, CA

Visit us in Booth #441 to learn about the power and versatility of the electrospinning technique and discover all our solutions for medical device development and manufacturing. We will be running live demonstrations of our advanced electrospinning equipment and offering test drives of the best-selling desktop SEM to visualize the microstructure of the nanofiber samples. Our team of experts look forward to discussing how adding this technology to your lab will help you achieve your production goals!

Learn More about MD&M 2026

BLOGS

Broad Ion Beam vs. Focused Ion Beam Polishing: Choosing the Right Technique for Sample Preparation

When preparing samples for electron microscopy, the choice of method directly impacts the clarity and reliability of the images. Imperfections such as roughness, contamination, or surface damage can obscure fine …

Read More
Optical Microscopy vs SEM for Technical Cleanliness Analysis

The performance of sensitive systems such as engines, hydraulics, electronics, and medical devices can be compromised in cases of particle contamination; this reduces product quality and introduces risks of failure. …

Read More
Choosing Between Optical and SEM Techniques for Particle Characterization

Particle analysis, which typically focuses on parameters such as size, shape, distribution, concentration, and composition, plays a critical role across a wide range of industries, from pharmaceuticals and biotechnology to …

Read More
A Guide to Particle Analysis: Key Methods, Applications, and Benefits

What is Particle Analysis? Particle analysis is the measurement and characterization of particles in a sample. Particle analysis typically focuses on properties such as particle size and size distribution, shape …

Read More
Desktop SEMs: Advanced Imaging Without the Infrastructure

Scanning Electron Microscopes (SEMs) are indispensable tools for analyzing surface morphology, materials composition, and microstructural details at high resolution. They are used extensively across research institutions, manufacturing lines, forensic labs, …

Read More

APPLICATION SUPPORT

Hosted at our state-of-the-art facilities, this immersive 2-day program is designed for both experienced practitioners and newcomers, offering an in-depth exploration of both fundamental and advanced SEM techniques.

Seats are limited to ensure direct access to instructors and hands-on time with the instruments, and spots are reserved on a first-come-first-served basis.

Phoenix, AZ SEM Short Course | February 18 – 19, 2026

Register Today

Alexandria, VA SEM Short Course | April 8 – 9, 2026

Register Today
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