Scanning Electron Microscopy (SEM) has become a vital tool in geology, offering high-resolution imaging and elemental analysis for understanding the composition, texture, and geologic history of rocks, minerals, and fossils. While traditional SEMs have been limited to specialized labs due to their size and complexity, desktop SEMs (like the Phenom series) are making this powerful technology accessible to more users.
This webinar will explore how compact SEM systems deliver high-resolution imaging of features such as mineral morphology, grain boundaries, and microfossils, while integrated EDS enables rapid in-situ chemical analysis for mineral identification and phase mapping. Additionally, advanced features like image stitching allow users to capture large composite images of entire thin sections or hand samples in high detail. We’ll also cover key sample preparation techniques (including sputter coating, polishing, and Broad Ion Beam (BIB) milling) that enhance imaging quality and reveal hidden structures.
Whether you’re analyzing bulk rocks, thin sections, sediments or fossilized remains, desktop SEMs provide a practical, cost-effective solution for industry, research, and teaching. Join us to discover how these versatile systems are transforming geologic investigations at the microscale.
