Superfast Imaging for Electron Microscopy: Up to 100x Faster, 100x Less Data and 100x Less Dose

Originally Aired:

Date: June 5, 2025

Abstract:

In this webinar, we will introduce ‘Compressed Sensing’ software from SenseAI, which samples a fraction of the data without loss of any inherent information. This generates images faster with significantly reduced beam damage and up to 100x less data. Most importantly, there is no loss of integrity of the images.

Professor Nigel Browning, co-founder and CSO of SenseAI will discuss the limitations in current imaging techniques, from beam damage to slowness, complexity and poor results. Nigel will then introduce the SenseAI software with a live demo of it in action.

The webinar will also feature a case study from King’s College London in the UK, who are using SenseAI to reduce beam damage, improve image quality, work much faster and reduce the amount of data used. Professor Roland Fleck, Academic Director of the Centre for Ultrastructural Imaging at King’s College London will discuss how the compressive sensing software from SenseAI enables them to collect better quality images at a fraction of the data, working much faster than they would otherwise, saving costs, and generating much higher success rates.

Presentation By:

Nigel Browning
Chair of Electron Microscopy
SenseAI / University of Liverpool



Related Webinars:

Scanning Electron Microscopy, Transmission Electron Microscopy

Real-time, low dose 4D-STEM Imaging

In this webinar, we will introduce the NEW low dose, live imaging for 4D-STEM from SenseAI…

Scanning Electron Microscopy

Applications for Desktop SEM in Geology

Scanning Electron Microscopy (SEM) has become a vital tool in geology, offering high-resol…

Scanning Electron Microscopy

Using Automated SEM/EDS Analysis to Enhance Parts Cleanliness

Maintaining technical cleanliness is critical in industries where contamination can compro…

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.