How Much Does a Scanning Electron Microscope (SEM) Cost?
A scanning electron microscope (SEM) is a powerful scientific instrument used for high-resolution imaging and surface elemental analysis. They work by scanning a focused beam of electrons across the sample’s surface and detecting the resulting signals to create detailed images. SEMs provide value in a wide range of applications including materials science, biology, nanotechnology, forensics, […]
Visualizing Skin Tissue Morphology with Scanning Electron Microscopy
The skin is the ultimate barrier to the human body, protecting it from mechanical damage, radiation, extreme temperatures, and pathogens. The skin consists of three layers: the epidermis (outer layer), dermis (middle), and hypodermis (inner layer). Each layer serves a distinct purpose. The epidermis provides the primary barrier whereas the dermis and hypodermis contain hair follicles, sweat glands, connective tissue, and fat to provide mechanical strength and warmth to our bodies. During minor injuries, the skin can normally regenerate the damaged areas on its own. In cases of extensive injuries, such as through disease or burn wounds, the skin is unable to regenerate on its own which leads to scar tissue formation or in worst cases, chronic wounds that need medical attention.
Using the Phenom Desktop SEM for Quality Control at Menlo Micro
“We discovered Phenom has the best value with results close to a full-size SEM” – Dr Naomi C., Menlo Micro
On occasion, we are given the opportunity to watch, learn, and broadcast some of the most fascinating inventions of our time. Today is that day of sharing.
The Air Water Interface and Sample Preparation for Cryo-EM
The air-water interface (AWI) is essentially the chaotic boundary where a solution meets the air. When protein molecules in solution contact the AWI, they tend to align themselves along the interface with the hydrophilic regions facing inward towards the water environment and the hydrophobic regions facing outwards towards the air environment. The AWI presents one […]
Workflow Automation in SEM Analysis
Scanning electron microscopy (SEM) is an extremely versatile analytical technique that produces high-resolution images by scanning a focused electron beam across a sample surface. Within the SEM, multiple detectors capture different signals generated through beam-sample interactions so that surface morphology and elemental composition can be visualized at nanometer resolution. The superior resolving power of SEMs […]
FT-IR, Raman, and Electron Microscopy Day with Thermo Fisher
We are pleased to invite you to an exciting event showcasing the latest advances in scanning electron microscopy (SEM) along with FT-IR and Raman spectroscopy. At this event, you will have the opportunity to meet with our microscopy specialists for in-person demonstrations of the Phenom Desktop SEM. Bring your samples! You will be able to […]
Which Electron Source is Best?
The electron source is one of the most important components of a scanning electron microscope (SEM) and is a major factor in determining its maximum analytical performance. There are three common types of electron sources found in SEMs: tungsten filaments, solid state hexaboride crystals, and field emission guns. How do electron sources work? As the […]
Why Use An SEM in Battery Research?
The functional properties of a battery, not limited to just its performance, are inherently dependent upon the microstructure and surface morphology of electrodes and separators. Scanning electron microscopy is a widely used tool in battery research to study the properties of components, as well as to investigate the interface between the electrode and electrolyte. SEM […]
Electron Microscopy Workshop with ASU’s School of Earth and Space Exploration
You’re invited to experience scanning electron microscopy firsthand with the Phenom Desktop SEM, guided by our own experts in live demo sessions and provided with presentations about additional EM instrumentation. Our collaborative workshop with the Buseck Center for Meteorite Studies of Arizona State University is a unique opportunity to delve into Desktop SEM, in situ […]
How to Combat Electric Charge Buildup in Scanning Electron Microscopy
The fundamental unit of electric charge is the electron, an elementary particle that can be used in the domain of microscopy to see beyond the diffraction limit of optical light and uncover the microscale characteristics of many different types of materials. A scanning electron microscope (SEM) is an analytical tool that creates highly magnified images […]